Spectromicroscopy and Imaging of Photoexcited Electron Dynamics at in-plane Silicon pn Junction

Nanoscale ◽  
2021 ◽  
Author(s):  
Aiqin Hu ◽  
Wei Liu ◽  
Xiaofang Li ◽  
Shengnan Xu ◽  
Yaolong Li ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Dynamic Processes ◽  
Electron Dynamics ◽  
Photoexcited Electron ◽  
Photoemission Electron Microscopy ◽  
Electron Dynamic ◽  
Pn Junction ◽  
Time And Energy ◽  
Photoemission Electron

Ultrafast spatiotemporal imaging of photoexcited electrons is essential to understanding the interfacial electron dynamic processes. We used a time- and energy-resolved Photoemission Electron Microscopy (PEEM) to investigate the photoexcited electron...

Ultrafast electron dynamics in twisted graphene by femtosecond photoemission electron microscopy

Carbon ◽  
2017 ◽  
Vol 124 ◽  
pp. 49-56 ◽  
Author(s):  
Keiki Fukumoto ◽  
Mohamed Boutchich ◽  
Hakim Arezki ◽  
Ken Sakurai ◽  
Daniela Di Felice ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Dynamics ◽  
Photoemission Electron Microscopy ◽  
Twisted Graphene ◽  
Photoemission Electron ◽  
Ultrafast Electron Dynamics

Ultrafast Electron Cooling and Decay in Monolayer WS2 Revealed by Time- and Energy-Resolved Photoemission Electron Microscopy

Nano Letters ◽  
2020 ◽  
Vol 20 (5) ◽  
pp. 3747-3753 ◽  
Author(s):  
Yaolong Li ◽  
Wei Liu ◽  
Yunkun Wang ◽  
Zhaohang Xue ◽  
Yu-Chen Leng ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Cooling ◽  
Photoemission Electron Microscopy ◽  
Time And Energy ◽  
Photoemission Electron

Interferometric time- and energy-resolved photoemission electron microscopy for few-femtosecond nanoplasmonic dynamics

2019 ◽  
Vol 90 (9) ◽  
pp. 093904 ◽  
Author(s):  
Alexander Gliserin ◽  
Soo Hoon Chew ◽  
Sungho Choi ◽  
Kyoungmin Kim ◽  
Daniel T. Hallinan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoemission Electron Microscopy ◽  
Time And Energy ◽  
Photoemission Electron

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

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