12-state multi-level cell storage implemented in a 128 Mb phase change memory chip

Nanoscale ◽  
2021 ◽  
Author(s):  
Zhitang Song ◽  
Daolin Cai ◽  
Yan Cheng ◽  
Lei Wang ◽  
Shilong Lv ◽  
...  

128 Mb Phase Change Memory (PCM) chips show potential for many applications in artificial intelligence.

Nanoscale ◽  
2021 ◽  
Author(s):  
Zhitang Song ◽  
Daolin Cai ◽  
Yan Cheng ◽  
Lei Wang ◽  
Shilong Lv ◽  
...  

Correction for ‘12-state multi-level cell storage implemented in a 128 Mb phase change memory chip’ by Zhitang Song et al., Nanoscale, 2021, DOI: 10.1039/d1nr00100k.


2011 ◽  
Vol 11 (2) ◽  
pp. e79-e81 ◽  
Author(s):  
Gang Zhang ◽  
Zhe Wu ◽  
Jeung-Hyun Jeong ◽  
Doo Seok Jeong ◽  
Won Jong Yoo ◽  
...  

2009 ◽  
Vol 44 (1) ◽  
pp. 217-227 ◽  
Author(s):  
Ferdinando Bedeschi ◽  
Rich Fackenthal ◽  
Claudio Resta ◽  
Enzo Michele Donze ◽  
Meenatchi Jagasivamani ◽  
...  

Micromachines ◽  
2019 ◽  
Vol 10 (7) ◽  
pp. 461 ◽  
Author(s):  
Chenchen Xie ◽  
Xi Li ◽  
Houpeng Chen ◽  
Yang Li ◽  
Yuanguang Liu ◽  
...  

Multi-level cell (MLC) phase change memory (PCM) can not only effectively multiply the memory capacity while maintaining the cell area, but also has infinite potential in the application of the artificial neural network. The write and verify scheme is usually adopted to reduce the impact of device-to-device variability at the expense of a greater operation time and more power consumption. This paper proposes a novel write operation for multi-level cell phase change memory: Programmable ramp-down current pulses are utilized to program the RESET initialized memory cells to the expected resistance levels. In addition, a fully differential read circuit with an optional reference current source is employed to complete the readout operation. Eventually, a 2-bit/cell phase change memory chip is presented with a more efficient write operation of a single current pulse and a read access time of 65 ns. Some experiments are implemented to demonstrate the resistance distribution and the drift.


2021 ◽  
Author(s):  
Bin Liu ◽  
Kaiqi Li ◽  
Wanliang Liu ◽  
Jian Zhou ◽  
Liangcai Wu ◽  
...  

2013 ◽  
Vol 60 (6) ◽  
pp. 1521-1533 ◽  
Author(s):  
Gael F. Close ◽  
Urs Frey ◽  
Jack Morrish ◽  
Richard Jordan ◽  
Scott C. Lewis ◽  
...  

2014 ◽  
Vol 543-547 ◽  
pp. 471-474
Author(s):  
Qian Wang ◽  
Hou Peng Chen ◽  
Yi Yun Zhang ◽  
Xi Fan ◽  
Xi Li ◽  
...  

Design of a novel initialization circuit is presented in this paper. The initialization circuit is used to supply initialization current to the first test of phase change memory chip after delivery. Inhomogeneous crystalline grain sizes appear in phase change materials used in memory cells during manufacturing process. The crystalline phase with low resistance will convert to amorphous phase with high resistance after initialization, which is called RESET the memory cells to 0. Normal RESET operation current is not high enough to RESET great grain, which deteriorates bit yield of phase change memory chip. In comparison, the higher initialization current will increase bit yield observably.


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