Evaluation of relative beam-profile-compensated quantum yield of upconverting nanoparticles over a wide dynamic range of power densities

Nanoscale ◽  
2022 ◽  
Author(s):  
Jean de Souza Matias ◽  
Katarzyna Komolibus ◽  
Sanathana Konugolu Venkata Sekar ◽  
Stefan Andersson-Engels

The presented work uses a discrete strategy of beam profile compensation to evaluate the local internal quantum yield (iQY) of upconverting nanoparticles (UCNPs) at the pixel level of the beam...

1985 ◽  
Vol 32 (5) ◽  
pp. 1967-1969 ◽  
Author(s):  
D. M. Lee ◽  
D. Brown ◽  
R. Hardekopf ◽  
J. R. Bilskie ◽  
O. B. van Dyck

Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).


2020 ◽  
Vol 13 (5) ◽  
pp. 1085-1093
Author(s):  
XU Da ◽  
◽  
YUE Shi-xin ◽  
ZHANG Guo-yu ◽  
SUN Gao-fei ◽  
...  

Nano Energy ◽  
2021 ◽  
Vol 85 ◽  
pp. 105970
Author(s):  
Lianhui Li ◽  
Shouwei Gao ◽  
Mingming Hao ◽  
Xianqing Yang ◽  
Sijia Feng ◽  
...  

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