scholarly journals Direct observation and assessment of phase states of ambient and lab-generated sub-micron particles upon humidification

RSC Advances ◽  
2021 ◽  
Vol 11 (25) ◽  
pp. 15264-15272
Author(s):  
Zezhen Cheng ◽  
Noopur Sharma ◽  
Kuo-Pin Tseng ◽  
Libor Kovarik ◽  
Swarup China
Keyword(s):  
Electron Microscope ◽  
Relative Humidity ◽  
Scanning Electron Microscope ◽  
Direct Observation ◽  
Phase State ◽  
Environmental Scanning ◽  
Cooling Stage ◽  
Peltier Cooling ◽  
Individual Particles ◽  
Scanning Electron

We present a new analytical platform that uses a tilted and Peltier cooling stage interfaced with an environmental scanning electron microscope to directly observe and assess the phase state of individual particles as a function of relative humidity.

Research on Shrinkage and Cracking of Cement Paste Based on Environmental Scanning Electron Microscope

2011 ◽  
Vol 250-253 ◽  
pp. 489-492
Author(s):  
Yue Li ◽  
Chun E Sui ◽  
Xue Hui Li
Keyword(s):  
Regression Analysis ◽  
Electron Microscope ◽  
Relative Humidity ◽  
Scanning Electron Microscope ◽  
Cement Paste ◽  
Cement Mortar ◽  
Environmental Scanning Electron Microscope ◽  
Environmental Scanning ◽  
Shrinkage Cracking ◽  
Scanning Electron

In order to study the shrinkage characteristics of cement paste, environmental scanning electron microscope was used to observe the microstructure shrinkage of cement paste and cement mortar under different humidity. The results showed that : with the relative humidity decreased from 80% to 10%, the shrinkage cracking of paste microstructure appeared in different degree and increased continuously,also the regression analysis showed the relative humidity and shrinkage was conical relationship.

Universal ESEM

1993 ◽  
Vol 51 ◽  
pp. 786-787
Author(s):  
G.D. Danilatos
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Vacuum ◽  
Natural Extension ◽  
Necessary Condition ◽  
Environmental Scanning ◽  
Detection Systems ◽  
Small Gain ◽  
Detection Medium ◽  
Scanning Electron

The environmental scanning electron microscope (ESEM) has evolved as the natural extension of the scanning electron microscope (SEM), both historically and technologically. ESEM allows the introduction of a gaseous environment in the specimen chamber, whereas SEM operates in vacuum. One of the detection systems in ESEM, namely, the gaseous detection device (GDD) is based on the presence of gas as a detection medium. This might be interpreted as a necessary condition for the ESEM to remain operational and, hence, one might have to change instruments for operation at low or high vacuum. Initially, we may maintain the presence of a conventional secondary electron (E-T) detector in a "stand-by" position to switch on when the vacuum becomes satisfactory for its operation. However, the "rough" or "low vacuum" range of pressure may still be considered as inaccessible by both the GDD and the E-T detector, because the former has presumably very small gain and the latter still breaks down.

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