scholarly journals Fault tolerance reliability evaluation in multistage interconnection network

Author(s):  
N.A.M. Yunus ◽  
M. Othman
2005 ◽  
Vol 06 (04) ◽  
pp. 361-382 ◽  
Author(s):  
K. V. Arya ◽  
R. K. Ghosh

This paper proposes a technique to modify a Multistage Interconnection Network (MIN) to augment it with fault tolerant capabilities. The augmented MIN is referred to as Enhanced MIN (E-MIN). The technique employed for construction of E-MIN is compared with the two known physical fault tolerance techniques, namely, extra staging and chaining. EMINs are found to be more generic than extra staged networks and less expensive than chained networks. The EMIN realizes all the permutations realizable by the original MIN. The routing strategies under faulty and fault free conditions are shown to be very simple in the case of E-MINs.


Author(s):  
Shilpa Gupta ◽  
G. L. Pahuja

In parallel and distributed systems, multistage interconnection network (MIN) plays an important role for its efficient communication between processor and memory at a very low cost. A major class of MIN called Gamma network is known for its redundant network topology and is being used in broadband communication systems. The increased redundancy incorporation makes these networks more complex and hence reliability evaluation becomes complex. The performance evaluation of these network topologies requires reliability evaluation utilizing routing mechanism or techniques. In this paper, we have proposed four topologies of Gamma-Minus network using MUX and DEMUX. Terminal Reliability (TR), fault tolerance and routing schemes of Gamma-Minus network topologies proposed have been computed by utilizing different connection patterns of MUX/DEMUX. Also, performance indices such as TR, Reliability Cost Ratio (RCR), Fault Tolerance, etc. computed for different Gamma-Minus architectures have been compared with the existing Gamma networks, other than Gamma-Minus. All the performance indices for different Gamma-Minus topologies show improvement over the performance indices of different Gamma networks. The proposed Gamma-Minus architectures have been compared among themselves and also Gamma-Minus2 shows the best performance for all performance indices. To the best of our knowledge, most of the researchers have not compared fault tolerance and RCR performance measure.


Author(s):  
Vipin Sharma ◽  
Abdul Q. Ansari ◽  
Rajesh Mishra

Purpose The purpose of this paper is to design a efficient layout of Multistage interconnection network which has cost effective solution with high reliability and fault-tolerence capability. For parallel computation, various multistage interconnection networks (MINs) have been discussed hitherto in the literature, however, these networks always required further improvement in reliability and fault-tolerance capability. The fault-tolerance capability of the network can be achieved by increasing the number of disjoint paths as a result the reliability of the interconnection networks is also improved. Design/methodology/approach This proposed design is a modification of gamma interconnection network (GIN) and three disjoint path gamma interconnection network (3-DGIN). It has a total seven number of paths for all tag values which is uniform out of these seven paths, three paths are disjoint paths which increase the fault tolerance capability by two faults. Due to the presence of more paths than the GIN and 3-DGIN, this proposed design is more reliable. Findings In this study, a new design layout of a MIN has been proposed which provides three disjoint paths and uniformity in terms of an equal number of paths for all source-destination (S-D) pairs. The new layout contains fewer nodes as compared to GIN and 3-DGIN. This design provides a symmetrical structure, low cost, better terminal reliability and provides an equal number of paths for all tag values (|S-D|) when compared with existing MINs of this class. Originality/value A new design layout of MINs has been purposed and its two terminal reliability is calculated with the help of the reliability block diagram technique.


1994 ◽  
Vol 49 (3) ◽  
pp. 145-150 ◽  
Author(s):  
Zoran Jovanović ◽  
Jelena Mišić

2020 ◽  
Vol 30 (02) ◽  
pp. 2050009
Author(s):  
Qifan Zhang ◽  
Liqiong Xu ◽  
Weihua Yang ◽  
Shanshan Yin

Let [Formula: see text] be a non-complete graph, a subset [Formula: see text] is called a [Formula: see text]-component cut of [Formula: see text], if [Formula: see text] is disconnected and has at least [Formula: see text] components. The cardinality of the minimum [Formula: see text]-component cut is the [Formula: see text]-component connectivity of [Formula: see text] and is denoted by [Formula: see text]. The [Formula: see text]-component connectivity is a natural extension of the classical connectivity. As an application, the [Formula: see text]-component connectivity can be used to evaluate the reliability and fault tolerance of an interconnection network structure based on a graph model. In a previous work, E. Cheng et al. obtained the [Formula: see text]-component connectivity of the generalized exchanged hypercube [Formula: see text] for [Formula: see text] and [Formula: see text]. In this paper, we continue the work and determine that [Formula: see text] for [Formula: see text]. Moreover, we show that every optimal [Formula: see text]-component cut of [Formula: see text] is trivial for [Formula: see text] and [Formula: see text].


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