scholarly journals Portfolio management for a wind-storage system based on distributionally robust optimisation considering a flexible ramping product

2020 ◽  
Vol 14 (16) ◽  
pp. 3192-3199
Author(s):  
Chenyang Huang ◽  
Hongyan Ma ◽  
Zheng Yan ◽  
Sijie Chen ◽  
Mingjie Li
Keyword(s):  
Portfolio Management ◽  
Storage System ◽  
Robust Optimisation ◽  
Distributionally Robust

scholarly journals WKS-type distributionally robust optimisation for optimal sub-hourly look-ahead economic dispatch

2020 ◽  
Vol 14 (12) ◽  
pp. 2237-2246
Author(s):  
Yang Liu ◽  
Xianbang Chen ◽  
Bin Li ◽  
Huaqiang Li ◽  
Yanli Ye
Keyword(s):  
Economic Dispatch ◽  
Robust Optimisation ◽  
Look Ahead ◽  
Distributionally Robust

A Color Coded STEM/SEM Image Storage System

1981 ◽  
Vol 39 ◽  
pp. 272-273
Author(s):  
Y. Kokubo ◽  
W. H. Hardy ◽  
J. Dance ◽  
K. Jones
Keyword(s):  
Image Processing ◽  
Electron Beam ◽  
Storage System ◽  
Particle Analysis ◽  
Specific Information ◽  
X Rays ◽  
Sem Image ◽  
Backscattered Electrons ◽  
Wide Range ◽  
Scanning Electron

A color coded digital image processing is accomplished by using JEM100CX TEM SCAN and ORTEC’s LSI-11 computer based multi-channel analyzer (EEDS-II-System III) for image analysis and display. Color coding of the recorded image enables enhanced visualization of the image using mathematical techniques such as compression, gray scale expansion, gamma-processing, filtering, etc., without subjecting the sample to further electron beam irradiation once images have been stored in the memory.The powerful combination between a scanning electron microscope and computer is starting to be widely used 1) - 4) for the purpose of image processing and particle analysis. Especially, in scanning electron microscopy it is possible to get all information resulting from the interactions between the electron beam and specimen materials, by using different detectors for signals such as secondary electron, backscattered electrons, elastic scattered electrons, inelastic scattered electrons, un-scattered electrons, X-rays, etc., each of which contains specific information arising from their physical origin, study of a wide range of effects becomes possible.

Selecting and installing a portfolio management system

1999 ◽  
Vol 10 (1) ◽  
pp. 17-26
Author(s):  
CHARLES WATERFIELD
Keyword(s):  
Portfolio Management ◽  
Management System
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