A Color Coded STEM/SEM Image Storage System

A color coded digital image processing is accomplished by using JEM100CX TEM SCAN and ORTEC’s LSI-11 computer based multi-channel analyzer (EEDS-II-System III) for image analysis and display. Color coding of the recorded image enables enhanced visualization of the image using mathematical techniques such as compression, gray scale expansion, gamma-processing, filtering, etc., without subjecting the sample to further electron beam irradiation once images have been stored in the memory.The powerful combination between a scanning electron microscope and computer is starting to be widely used 1) - 4) for the purpose of image processing and particle analysis. Especially, in scanning electron microscopy it is possible to get all information resulting from the interactions between the electron beam and specimen materials, by using different detectors for signals such as secondary electron, backscattered electrons, elastic scattered electrons, inelastic scattered electrons, un-scattered electrons, X-rays, etc., each of which contains specific information arising from their physical origin, study of a wide range of effects becomes possible.

Download Full-text

Advances in Scanning Electron Microscopy

MRS Bulletin ◽

10.1557/s0883769400057390 ◽

1991 ◽

Vol 16 (3) ◽

pp. 41-45 ◽

Cited By ~ 14

Author(s):

K. Sujata ◽

Hamlin M. Jennings

Keyword(s):

Electron Beam ◽

X Rays ◽

Backscattered Electrons ◽

Scanning Transmission ◽

Electron Microscopes ◽

Scanning Electron Microscopes ◽

Television Image ◽

Focused Beam ◽

Scanning Electron

Scanning electron microscopes offer several unique advantages and they have evolved into complex integrated instruments that often incorporate several important accessories. Their principle advantage stems from the method of constructing an image from a highly focused electron beam that scans across the surface of a specimen. The beam generates backscattered electrons and excites secondary electrons and x-rays in a highly localized “spot.” These signals can be detected, and the results of the analysis are displayed as a specific intensity on a screen at a position that represents the position of the electron spot. As with a television image, after a given period, information about the entire field of view is displayed on the screen, resulting in a complete image. If the specimen is thin, the same type of information can be gathered from the transmitted electrons, and a scanning transmission image is thus constructed.The scanning electron microscope is highly versatile and widely used. The quality of the image is related to its resolution and contrast, which, in turn, depend on the diameter of the focused beam as well as its energy and current. Because electron lenses have inherently high aberrations, the usable aperture angles are much smaller than in a light microscope and, therefore, the electron beam remains focused over a relatively large distance, giving these instruments a very large depth of focus.Scanning electron microscopes are versatile in their ability to detect and analyze a lot of information. As a result, modern versions of these instruments are equipped with a number of detectors. Developments are sometimes related to placing the detectors in a geometrically attractive position close to the specimen.

Download Full-text

X-ray micro tomography in the scanning electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100107678 ◽

1978 ◽

Vol 36 (1) ◽

pp. 106-107 ◽

Cited By ~ 1

Author(s):

W. Brünger

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Target Surface ◽

The Body ◽

X Rays ◽

Cross Sectional ◽

X Ray ◽

Micro Tomography ◽

Scanning Electron

Reconstructive tomography is a new technique in diagnostic radiology for imaging cross-sectional planes of the human body /1/. A collimated beam of X-rays is scanned through a thin slice of the body and the transmitted intensity is recorded by a detector giving a linear shadow graph or projection (see fig. 1). Many of these projections at different angles are used to reconstruct the body-layer, usually with the aid of a computer. The picture element size of present tomographic scanners is approximately 1.1 mm2.Micro tomography can be realized using the very fine X-ray source generated by the focused electron beam of a scanning electron microscope (see fig. 2). The translation of the X-ray source is done by a line scan of the electron beam on a polished target surface /2/. Projections at different angles are produced by rotating the object.During the registration of a single scan the electron beam is deflected in one direction only, while both deflections are operating in the display tube.

Download Full-text

The inactivation of α -chymotrypsin by ionizing radiations

Proceedings of the Royal Society of London Series A - Mathematical and Physical Sciences ◽

10.1098/rspa.1960.0088 ◽

1960 ◽

Vol 256 (1284) ◽

pp. 1-14 ◽

Cited By ~ 13

Keyword(s):

Electron Beam ◽

Solid State ◽

Low Voltage ◽

Kinetic Equations ◽

High Dose ◽

X Rays ◽

Dilute Solutions ◽

Active Centre ◽

Enhanced Sensitivity ◽

Wide Range

The inactivation of α -chymotrypsin by low-voltage X-rays and by 15 meV electrons has been studied over a range of concentrations extending from the solid enzyme to dilute solutions and the sensitivity D 37 / c , where D 37 is the dose required to cause in activation to 37 % of the original at concentration c , determined under varied circumstances. The sensitivity is constant in air over a wide range of concentrations, but in the solid state is greater by a factor of about 7. That the enhanced sensitivity in the solid state is connected with disorganization of the secondary structure is shown by the fact that after partial inactivation by irradiation the enzyme is more sensitive to in activation by heating. This view is also supported by the finding that oxygen has no significant effect on the irradiation (with 15 meV electrons) in the solid state, since there is no reason to expect that oxygen will influence the breakage of hydrogen bonds within the molecule. The sensitivities of the protease and esterase activities of the enzyme are the same, showing that only one kind of active centre is involved. The sensitivity also decreases at low concentrations of the enzyme. That this is not due to recombination of the radicals is shown by the finding that the effect is uninfluenced by varying the dose rate of the electron beam over a very wide range. An enhanced sensitivity is, however, observed in solutions from which the oxygen has been removed. It follows that secondary radicals, principally O 2 H , formed in the presence of oxygen are less effective than the primary radicals. Kinetic equations are deduced which represent the main features of this behaviour. A possible reason for the greater effectiveness of H than O 2 H is the ability of the former to penetrate into the protein molecule. It was also found that in dilute solutions containing oxygen the electron beam is more effective than the X-rays. This could be accounted for if equilibrium between the primary radicals and oxygen is not reached at the very high dose rates at which the electron pulses are delivered. In vacuo no differences in sensitiveness to the X-rays and the electrons were observed.

Download Full-text

Energy Filtered Electron Backscattering Images of 10-nm NbC and AIN Precipitates in Steels Computed by Monte Carlo Simulations

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100163216 ◽

1996 ◽

Vol 54 ◽

pp. 150-151

Author(s):

Raynald Gauvin ◽

Dominique Drouin ◽

Pierre Hovington

Keyword(s):

Monte Carlo ◽

Electron Beam ◽

Electron Microscope ◽

Materials Science ◽

Specimen Preparation ◽

Backscattered Electrons ◽

Electron Backscattering ◽

Transmission Electron ◽

Properties Of Materials ◽

Scanning Electron

In modern materials science, it is important to improve the resolution of the Scanning Electron Microscope (SEM) because small phases play a crutial role in the properties of materials. The Transmission Electron Microscope (TEM) is the tool of choice for imaging small phases embedded in a given matrix. However, this technique is expensive and also is slow owing to specimen preparation. In this context, it is important to improve spatial resolution of the SEM.In electron backscattering images, it is well know that the backscattered electrons have an energetic distribution when they escape the specimen.The electrons having loss less energy are those which have travelled less in the specimen and thus escape closer to the electron beam. So, in filtering the energy of the backscattering electron and keeping those which have loss only a small amount of energy to create the image, a significant improvement of the resolution of such images is expected. New detectors are now under development to take advantage of this technique of imaging.

Download Full-text

Research on microstructure properties of clay-sand mixtures studied by ipp and mip methods

10.36381/iamsti.1.2020.16-23 ◽

2020 ◽

pp. 16-23

Author(s):

QI DAOZHENG ◽

GU CONG ◽

FU JIAJIA ◽

WANG YAO

Keyword(s):

Electron Microscopy ◽

Image Processing ◽

Scanning Electron Microscopy ◽

Mercury Intrusion Porosimetry ◽

Fractal Theory ◽

Sand Content ◽

Sem Images ◽

Mercury Intrusion ◽

Sem Image ◽

Scanning Electron

The clay-sand mixtures with diferent partcle sizes were prepared to investgate partcle and pore characteristcs. The microstructure characteristcs of the sand-clay mixtures were studied by the Mercury Intrusion Porosimetry (MIP) test and Scanning Electron Microscopy (SEM). Image-Pro Plus (IPP) image processing sofware was used to quantfy SEM images which investgated the micro-mechanism of structural evoluton of mixtures under diferent gradatons. The research results indicate that the units of mixtures develop from platelets and honeycomb to agglomerated and granular with the increase of sand content. The contact between partcles transits from face-face contacts to edge-face and pointface contacts. This artcle evaluated the fractal characteristc of partcle and pore structure based on the fractal theory. With the increase Circularity of the partcles, the ordered arrangement of the partcles in the mixed soil is further reduced. In general, the distributon of pores changes from intergranular pores to pores in aggregate, which provides a theoretcal basis for further study on the micro-macro correlaton of mixtures.

Download Full-text

Colloidal Gold Markers: Preparation and Cell Labeling for Transmission and Scanning Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100119478 ◽

1985 ◽

Vol 43 ◽

pp. 530-533

Author(s):

Robert S. Molday

Keyword(s):

Cell Surface ◽

Colloidal Gold ◽

Critical Evaluation ◽

Cell Labeling ◽

Electron Microscopic ◽

Thin Sections ◽

Gold Particles ◽

Backscattered Electrons ◽

Wide Range ◽

Scanning Electron

Colloidal gold particles have become one of the most widely used markers to detect, localize and, in some cases, quantitate cell surface and intracellular antigens and receptors since their introduction as transmission electron microscopic (TFM) markers by Faulk and Taylor in 1971 and as scanning electron microscopic (SEM) markers by Horisberger et al. in 1975. This interest in colloidal gold markers for cell labeling is based on their versatile properties for detection under the electron microscope. Colloidal gold particles are highly electron-dense which enables them to be seen under the TEM in thin sections of heavily stained cells. They can be prepared in a wide range of highly uniform sizes for visualization at different magnifications and for multiple labeling studies. Under the SEM, gold particles emit a high quantity of secondary electrons, backscattered electrons and characteristic X-ray signals and as a result, with the appropriate detectors, they can be readily distinguished from cell surface structures having a similar morphological appearance. The successful application of colloidal gold particles as markers for TEM and SEM however requires (i) careful preparation and characterization of both the gold markers and the ligand (protein)-gold conjugates, (ii) utilization of specific labeling techniques employing necessary controls to confirm the specificity of labeling, and (iii) critical evaluation of results in relation to the conditions used in labeling. These aspects of gold labeling will be considered here. Additional information can be obtained from recent reviews dealing specifically with gold markers and more generally with cell labeling techniques.

Download Full-text

Combined Electron Excitation and X-Ray Excitation for Spectrometry in the SEM

Microscopy Today ◽

10.1017/s1551929513000709 ◽

2013 ◽

Vol 21 (4) ◽

pp. 24-28 ◽

Cited By ~ 4

Author(s):

Kenny C. Witherspoon ◽

Brian J. Cross ◽

Mandi D. Hellested

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Electron Excitation ◽

X Rays ◽

X Ray ◽

Analytical Technique ◽

Atomic Electrons ◽

Non Destructive ◽

Scanning Electron

Energy-dispersive X-ray spectrometry (EDS) is an analytical technique used to determine elemental composition. It is a powerful, easy-to-use, non-destructive technique that can be employed for a wide variety of materials. In this technique the electron beam of the scanning electron microscope (SEM) impinges on the sample and excites atomic electrons causing the production of characteristic X rays. These characteristic X rays have energies specific to elements in the sample. The EDS detector collects these X rays as a signal and produces a spectrum. Samples also can be excited by X rays. Collimated and focused X rays from an X-ray source produce characteristic X rays that can be detected by the same EDS detector. When X rays are used as the source of excitation, the method is then called X-ray fluorescence (XRF) or micro-XRF.

Download Full-text

Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Micrsoscope

Microscopy and Microanalysis ◽

10.1017/s1431927600036485 ◽

2000 ◽

Vol 6 (S2) ◽

pp. 798-799

Author(s):

S.A. Wight ◽

C.J. Zeissler

Keyword(s):

Electron Beam ◽

Direct Measurement ◽

Electron Scattering ◽

Measurement Data ◽

Primary Electron ◽

Environmental Scanning ◽

Imaging Plate ◽

X Rays ◽

Primary Electron Beam ◽

Scanning Electron

In this work, phosphor imaging plate technology is applied to measure electron scattering directly in the environmental scanning electron microscope (ESEM) specimen chamber. The scattering of electrons from the primary electron beam, under relatively high-pressure conditions (266 Pa) in the ESEM sample chamber, degrades the analytical accuracy of elemental analysis. The degree of this degradation is poorly known. To date, attempts to measure experimentally the spatial distribution of the scattered electrons have been limited to observing secondary effects such as the intensity of x-rays produced from copper targets positioned at various distances from the primary electron beam interaction point. A more accurate distribution of the scattered electron intensity can be obtained from a direct measurement of both the scattered and unscattered electrons over a large area with single electron sensitivity. Improvements to the accuracy of Monte Carlo models of the scattering process will be made possible by the direct measurement data.

Download Full-text

Chan-Vese Segmentation of SEM FerritePearlite Microstructure and Prediction of Grain Boundary

International Journal of Innovative Technology and Exploring Engineering - Special Issue ◽

10.35940/ijitee.k2553.0981119 ◽

2019 ◽

Vol 8 (11) ◽

pp. 3434-3437

Keyword(s):

Image Processing ◽

Grain Boundary ◽

Phase Region ◽

Set Covering ◽

Phase Identification ◽

Data Set ◽

Steel Microstructure ◽

Sem Image ◽

Wide Range ◽

Segmentation Task

The image processing of microstructure for design, measure and control of metal processing has been emerging as a new area of research for advancement towards the development of Industry 4.0 framework. However, exact steel phase segmentation is the key challenge for phase identification and quantification in microstructure employing proper image processing tool. In this article, we report effectiveness of a region based segmentation tool, Chan-Vese in phase segmentation task from a ferrite- pearlite steel microstructure captured in scanning electron microscopy image (SEM) image. The algorithm has been applied on microstructure images and the results are discussed in light of the effectiveness of Chan-Vese algorithms on microstructure image processing and phase segmentation application. Experiments on the ferrite perlite microstructure data set covering a wide range of resolution revealed that the Chan-Vese algorithm is efficient in segmentation of phase region and predicting the grain boundary.

Download Full-text