Atom-Probe Field-Ion Microscopy Investigation of CMSX-4 Ni-Base Superalloy Laser Beam Welds

Journal de Physique IV (Proceedings) ◽

10.1051/jp4:1996541 ◽

1996 ◽

Vol 06 (C5) ◽

pp. C5-253-C5-258 ◽

Author(s):

S. S. Babu ◽

S. A. David ◽

J. M. Vitek ◽

M. K. Miller

Keyword(s):

Probe Field ◽

Field Ion Microscopy ◽

Microscopy Investigation ◽

Ion Microscopy ◽

Base Superalloy

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Atom probe field-ion microscopy investigation of nickel base superalloy welds

10.2172/290932 ◽

1998 ◽

Author(s):

S.S. Babu ◽

S.A. David ◽

J.M. Vitek ◽

M.K. Miller

Keyword(s):

Nickel Base Superalloy ◽

Probe Field ◽

Field Ion Microscopy ◽

Microscopy Investigation ◽

Ion Microscopy ◽

Nickel Base ◽

Base Superalloy

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Atom probe field ion microscopy investigation of boron containing martensitic 9 pct chromium steel

Metallurgical and Materials Transactions A ◽

10.1007/s11661-000-0039-9 ◽

2000 ◽

Vol 31 (3) ◽

pp. 975-984 ◽

Author(s):

P. Hofer ◽

M. K. Miller ◽

S. S. Babu ◽

S. A. David ◽

H. Cerjak

Keyword(s):

Chromium Steel ◽

Probe Field ◽

Field Ion Microscopy ◽

Microscopy Investigation ◽

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THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1984962 ◽

1984 ◽

Vol 45 (C9) ◽

pp. C9-373-C9-378 ◽

Author(s):

A. J. Melmed ◽

M. E. Twigg ◽

R. Klein ◽

M. J. Kaufman ◽

H. L. Fraser

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Analytical Transmission Electron Microscopy ◽

Probe Field ◽

Field Ion Microscopy ◽

Transmission Electron ◽

Ion Microscopy ◽

Base Superalloy

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Chemical composition measurements of a nickel-base superalloy by atom probe field ion microscopy

Materials Science and Engineering A ◽

10.1016/0921-5093(95)09825-9 ◽

1995 ◽

Vol 203 (1-2) ◽

pp. 69-74 ◽

Author(s):

Nelia Wanderka ◽

Uwe Glatzel

Keyword(s):

Chemical Composition ◽

Nickel Base Superalloy ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy ◽

Nickel Base ◽

Base Superalloy ◽

Composition Measurements

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Atom probe field ion microscopy investigation of boron containing martensitic 9 Pct chromium steel

Metallurgical and Materials Transactions A ◽

10.1007/s11661-000-1015-0 ◽

2000 ◽

Vol 31 (13) ◽

pp. 975-984 ◽

Author(s):

P. Hofer ◽

M. K. Miller ◽

S. S. Babu ◽

S. A. David ◽

H. Cerjak

Keyword(s):

Chromium Steel ◽

Probe Field ◽

Field Ion Microscopy ◽

Microscopy Investigation ◽

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Atom probe field ion microscopy investigation of the early interreaction stages in Al/Ni couples

Materials Science and Engineering A ◽

10.1016/s0921-5093(99)00230-0 ◽

1999 ◽

Vol 270 (1) ◽

pp. 64-68 ◽

Author(s):

T. Jeske ◽

G. Schmitz ◽

R. Kirchheim

Keyword(s):

Probe Field ◽

Field Ion Microscopy ◽

Microscopy Investigation ◽

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AN ATOM PROBE FIELD ION MICROSCOPY STUDY OF DISLOCATION-SOLUTE INTERACTIONS NEAR TWIN BOUNDARIES IN WEB SILICON

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1988685 ◽

1988 ◽

Vol 49 (C6) ◽

pp. C6-503-C6-507 ◽

Author(s):

R. JAYARAM ◽

J. A. SPITZNAGEL

Keyword(s):

Microscopy Study ◽

Twin Boundaries ◽

Probe Field ◽

Field Ion Microscopy ◽

Solute Interactions ◽

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Microstructural development in PWA-1480 electron beam welds — an atom probe field ion microscopy study

Applied Surface Science ◽

10.1016/0169-4332(95)00387-8 ◽

1996 ◽

Vol 94-95 ◽

pp. 280-287 ◽

Author(s):

S.S. Babu ◽

S.A. David ◽

M.K. Miller

Keyword(s):

Electron Beam ◽

Microscopy Study ◽

Microstructural Development ◽

Probe Field ◽

Field Ion Microscopy ◽

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Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, auger electron spectroscopy, and atom-probe field-ion microscopy

Surface Science Letters ◽

10.1016/0167-2584(82)90422-4 ◽

1982 ◽

Vol 120 (1) ◽

pp. A329

Author(s):

M. Futamoto ◽

I. Yuito ◽

U. Kawabe ◽

O. Nishikawa ◽

Y. Tsunashima ◽

...

Keyword(s):

Titanium Carbide ◽

Electron Emission ◽

Electron Spectroscopy ◽

Auger Electron ◽

Probe Field ◽

Field Ion Microscopy ◽

Field Emitters ◽

Emission Microscopy ◽

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Chemical Homogeneity of NiPdP Metallic Glasses Studied by Atom Probe-Field Ion Microscopy / Feldionenmikroskop- und Atomsonden-Untersuchungen zur chemischen Homogenität metallener NiPdP-Gläser

International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) ◽

10.1515/ijmr-1989-800101 ◽

1989 ◽

Vol 80 (1) ◽

pp. 1-8

Author(s):

Michael Oehring

Keyword(s):

Metallic Glasses ◽

Probe Field ◽

Chemical Homogeneity ◽

Field Ion Microscopy ◽

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