THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY

Characteristic distances describing the scale of the spinodal microstructure obtained from Transmission Electron Microscopy (TEM), Atom Probe Field Ion Microscopy (APFIM), and Small Angle Neutron Scattering (SANS) are described and compared. These techniques provide a view of the microstructure either directly in real space or indirectly in reciprocal space. The material and its general microstructure are described in Part 1, elsewhere in these proceedings. Only the decomposition of the ferrite phase into a modulated isotropic microstructure consisting of a chromium-enriched α' phase and an iron-rich a phase is considered in this presentation.

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A Study of the Phase Decomposition of Fe-Ni-Al-Mo Alloys

MRS Proceedings ◽

10.1557/proc-186-219 ◽

1990 ◽

Vol 186 ◽

Author(s):

M.K. Miller ◽

M.G. Hetherington ◽

J.R. Weertman ◽

H.A. Calderon

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe ◽

Lattice Parameter ◽

Al Alloys ◽

Phase Decomposition ◽

Probe Field ◽

Transmission Electron ◽

The Matrix ◽

Ion Microscopy

AbstractThe aging of β′ NiAl precipitates in ferritic Fe-Ni-Al alloys has been studied by transmission electron microscopy (TEM) and atom-probe field-ion microscopy (APFIM). The addition of Mo alters the lattice parameter of the phases and segregation of Mo to the interface between the matrix and the particles may alter the interfacial energy. The compositions of the matrix, precipitates and interfaces have been measured by TEM and APFIM. The results are compared.

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Atom Probe Field Ion Microscopy and High Resolution Electron Microscopy: two complementary methods for atomic scale characterisation

2006 19th International Vacuum Nanoelectronics Conference ◽

10.1109/ivnc.2006.335304 ◽

2006 ◽

Author(s):

F. Danoix ◽

T. Gloriant ◽

T. Epicier ◽

F. Vurpillot ◽

W. Lefebvre

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

High Resolution Electron Microscopy ◽

Atom Probe ◽

Atomic Scale ◽

Probe Field ◽

Field Ion Microscopy ◽

Complementary Methods ◽

Resolution Electron ◽

Ion Microscopy

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Combined field ion microscopy and transmission electron microscopy of heavy ion damage in tungsten

Radiation Effects and Defects in Solids ◽

10.1080/10420159008220568 ◽

1990 ◽

Vol 115 (1-3) ◽

pp. 205-215

Author(s):

Krystyna Stiller

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Heavy Ion ◽

Field Ion Microscopy ◽

Transmission Electron ◽

Ion Damage ◽

Ion Microscopy

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Field Ion Microscopy of Tantalum-Carbon Alloys

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010006965x ◽

1970 ◽

Vol 28 ◽

pp. 532-533

Author(s):

P. Rao

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Thin Shell ◽

Photographic Recording ◽

General Morphology ◽

Field Ion Microscopy ◽

Bright Spots ◽

Transmission Electron ◽

Ion Microscopy ◽

Carbon System

Transmission electron microscopy has proved the existence of interstitial order in the tantalum-carbon system and the structure has been suggested to be tetragonal of composition Ta64C. Detection of interstitial order using field ion microscopy is shown to be possible by observing the general morphology of the interstitial atoms appearing as bright spots at the tip surface. This is necessitated by the fact that photographic recording of stable images from interstitial solid solutions is difficult due to the inherent instability of interstitials present at and in a thin shell of undetermined thickness below the surface. However, interstitial ordering, if present, should be detectable by the appearance of regularly spaced rings of carbon atoms when both species (metal and interstitial) are continuously field evaporating.

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