Wave Scattering by a Rigid Thin Barrier

1982 ◽  
Vol 108 (4) ◽  
pp. 479-491 ◽  
Author(s):  
Philip L-F. Liu ◽  
Madjid Abbaspour
Keyword(s):  
1999 ◽  
Vol 11 (1) ◽  
pp. 117-135
Author(s):  
P. Dineva ◽  
D. Gross ◽  
T. Rangelov

2018 ◽  
Vol 77 (16) ◽  
pp. 1409-1421 ◽  
Author(s):  
S. V. Nechitaylo ◽  
V. M. Orlenko ◽  
O. Sukharevsky ◽  
V. Vasylets

2017 ◽  
Vol 5 (1) ◽  
pp. 45-50
Author(s):  
Myron Voytko ◽  
◽  
Yaroslav Kulynych ◽  
Dozyslav Kuryliak

The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.


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