Longitudinal electron drift mobility of hydrogenated amorphous silicon/silicon nitride multilayer structures revealed by time‐of‐flight measurements

1989 ◽  
Vol 54 (12) ◽  
pp. 1118-1120 ◽  
Author(s):  
R. Hattori ◽  
J. Shirafuji
1989 ◽  
Vol 54 (19) ◽  
pp. 1911-1913 ◽  
Author(s):  
E. A. Schiff ◽  
R. I. Devlen ◽  
H. T. Grahn ◽  
J. Tauc ◽  
S. Guha

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