Evidence for a negative electron‐electron correlation energy in the dominant deep trapping center in silicon nitride films

1990 ◽  
Vol 56 (14) ◽  
pp. 1359-1361 ◽  
Author(s):  
Sean E. Curry ◽  
P. M. Lenahan ◽  
D. T. Krick ◽  
J. Kanicki ◽  
C. T. Kirk
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