Evidence for a negative electron‐electron correlation energy in the dominant deep trapping center in silicon nitride films
1980 ◽
Vol 72
(7)
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pp. 4244-4245
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2020 ◽
Vol 1172
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pp. 112669
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Keyword(s):
2004 ◽
Vol 710
(1-3)
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pp. 19-23
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1978 ◽
Vol 14
(1)
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pp. 91-100
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2006 ◽
Vol 428
(4-6)
◽
pp. 461-466
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1999 ◽
Vol 32
(22)
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pp. 5379-5395
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1992 ◽
Vol 4
(39)
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pp. 7877-7890
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Keyword(s):