Surface outgrowths on sputtered YBa2Cu3O7−xfilms: A combined atomic force microscopy and transmission electron microscopy study

Atomic Force Microscopy ◽

Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyanoquinodimethane thin film grown by vacuum evaporation

10.1116/1.1459723 ◽

2002 ◽

Vol 20 (2) ◽

pp. 673 ◽

Cited By ~ 3

Author(s):

J. C. Li ◽

W. M. Liu ◽

Z. Q. Xue

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Atomic Force Microscopy ◽

Pattern Formation ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Errata: “Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyano- quinodimethane thin film grown by vacuum evaporation” [J. Vac. Sci. Technol. B 20, 673 (2002)]

10.1116/1.1740769 ◽

2004 ◽

Vol 22 (3) ◽

pp. 1213

Author(s):

J. C. Li ◽

W. M. Liu ◽

Z. Q. Xue

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Atomic Force Microscopy ◽

Pattern Formation ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

IVMC 2001. Proceedings of the 14th International Vacuum Microelectronics Conference (Cat. No.01TH8586) ◽

Effects of high dose Pb/sup +/ implantation on Si: atomic force and transmission electron microscopy study

10.1109/ivmc.2001.939739 ◽

2002 ◽

Author(s):

C. Angelov ◽

P. Groudev

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

High Dose ◽

Atomic Force ◽

Effects of high dose Bi+ implantation on Si : An atomic force and transmission electron microscopy study

Vacuum ◽

10.1016/s0042-207x(98)00176-6 ◽

1998 ◽

Vol 51 (2) ◽

pp. 285-288 ◽

Cited By ~ 2

Author(s):

Ch Angelov ◽

J Faure ◽

M Kalitzova ◽

S Simov ◽

T Tzvetkova ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

High Dose ◽

Atomic Force ◽

High Resolution Transmission Electron Microscopy and Atomic Force Microscopy Study of Nanocrystalline Ferrites Synthesized by Reverse Micelle Technique Under Varied Conditions

Microscopy and Microanalysis ◽

10.1017/s1431927604880188 ◽

2004 ◽

Vol 10 (S02) ◽

pp. 402-403

Author(s):

Harish Nathani ◽

R. D. K Misra

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

High Resolution ◽

Reverse Micelle ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Cited By ~ 3

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

A SCANNING AND TRANSMISSION ELECTRON MICROSCOPY STUDY OF POOL BOILING SURFACES

10.1615/ihtc4.140 ◽

1970 ◽

Cited By ~ 2

Author(s):

G. H. Nix ◽

R.I. Vachon ◽

D. M. Hall

Keyword(s):

Electron Microscopy ◽

Pool Boiling ◽

Microscopy Study ◽

Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system

Philosophical Magazine Letters ◽

10.1080/095008396180407 ◽

1996 ◽

Vol 74 (2) ◽

pp. 57-66 ◽

Cited By ~ 34

Author(s):

L. Sagalowicz ◽

G. Lapasset ◽

G. Hug

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽