Study on excimer laser induced defects in SiO2films on Si by variable‐energy positron annihilation spectroscopy

1994 ◽  
Vol 64 (21) ◽  
pp. 2806-2808 ◽  
Author(s):  
M. Fujinami ◽  
N. B. Chilton
2005 ◽  
Vol 34 (3) ◽  
pp. 181-186
Author(s):  
V. I. Grafutin ◽  
O. V. Ilyukhina ◽  
G. G. Myasishcheva ◽  
V. V. Kalugin ◽  
E. P. Prokopiev ◽  
...  

2019 ◽  
Vol 517 ◽  
pp. 148-151 ◽  
Author(s):  
O.V. Ogorodnikova ◽  
L. Yu Dubov ◽  
S.V. Stepanov ◽  
D. Terentyev ◽  
Yu.V. Funtikov ◽  
...  

2004 ◽  
Vol 19 (23) ◽  
pp. 3951-3959 ◽  
Author(s):  
CORINE BAS ◽  
N. DOMINIQUE ALBÉROLA ◽  
MARIE-FRANCE BARTHE ◽  
JÉRÉMIE De BAERDEMAEKER ◽  
CHARLES DAUWE

A series of dense copolyimide membranes was characterized using positron annihilation spectroscopy. The positron annihilation lifetime spectroscopy performed on film with a classical positron source gives informations on the positronium fraction formed and also on the hole size within the film. The Doppler broadening spectra (DBS) of the gamma annihilation rays coupled with a variable energy positron beam allow the microstructural analyses as a function of the film depth. Experimental data were also linked to the chemical structure of the polyimides. It was found that the presence of the fluorine atoms strongly affects the positron annihilitation process and especially the DBS responses.


1997 ◽  
Vol 81 (5) ◽  
pp. 2451-2453 ◽  
Author(s):  
F. L. Freire ◽  
D. F. Franceschini ◽  
R. S. Brusa ◽  
G. R. Karwasz ◽  
G. Mariotto ◽  
...  

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