An iron‐core magnetic inductance probe to measure critical current densities in superconducting thin films

1992 ◽  
Vol 63 (4) ◽  
pp. 2248-2258
Author(s):  
T. L. Hylton ◽  
M. R. Beasley ◽  
R. C. Taber
Keyword(s):  
Thin Films ◽  
Critical Current ◽  
Iron Core ◽  
Superconducting Thin Films ◽  
Magnetic Inductance ◽  
Current Densities

Issues Concerning the Chemical Synthesis of Ceramic Superconducting Coatings in the Bi-Sr-Ca-Cu-O System with High Critical Current Densities.

1991 ◽  
Vol 249 ◽  
Author(s):  
S. J. Golden ◽  
K. J. Vaidya ◽  
T. E. Bloomer ◽  
F. F. Lange ◽  
D. R. Clarke
Keyword(s):  
Thin Films ◽  
Critical Current ◽  
Zero Field ◽  
Superconducting Thin Films ◽  
Ethyl Hexanoate ◽  
X Ray ◽  
Pole Figures ◽  
Oriented Films ◽  
Metalorganic Deposition ◽  
Current Densities

ABSTRACTSuperconducting thin films of the two Cu-layer phase in the Pb-doped Bi- Sr-Ca-Cu-O system have been fabricated on {100} LaAlO3 single crystals by the metalorganic deposition (MOD) from ethyl hexanoate precursors. Some of the major issues pertinent to the synthesis of high quality films have been studied.Thin films of composition Bi1.8Pb0.3Sr1.6CaCu2Ox given heat treatments in air at 850–860 °C for several hours had sharp resistive transitions with a Tc of 85–89 K. The zero-field transport critical current densities were in the range of 1–4×105 A.cm−2 at 77 K and 106 A.cm−2 at 45 K in 200–300 nm thick films. In contrast to caxis oriented films grown on (100) MgO, X-ray pole figures show that the polycrystalline films grown on (100) LaAlO3 are epitaxial, a result confirmed by electron channeling patterns.

Determination of critical current densities of YBa2Cu3O7−δ thin films from AC susceptibility measurements

1993 ◽  
Vol 205 (3-4) ◽  
pp. 311-322 ◽  
Author(s):  
W. Xing ◽  
B. Heinrich ◽  
J. Chrzanowski ◽  
J.C. Irwin ◽  
H. Zhou ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Current ◽  
Ac Susceptibility ◽  
Current Densities

Enhancement of critical current density in direct‐current‐sputtered TlBa2Ca2Cu3O9±δ superconducting thin films

1995 ◽  
Vol 66 (7) ◽  
pp. 885-887 ◽  
Author(s):  
J. Y. Juang ◽  
J. H. Horng ◽  
S. P. Chen ◽  
C. M. Fu ◽  
K. H. Wu ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Direct Current ◽  
Current Density ◽  
Superconducting Thin Films

scholarly journals Critical current densities of high pressure oxygen sputtered thin films of YBa2Cu3O7−x by non-resonant rf absorption method

Pramana ◽  
1993 ◽  
Vol 40 (2) ◽  
pp. 119-122 ◽  
Author(s):  
V V Srinivasu ◽  
S V Bhat ◽  
G K Muralidhar ◽  
G Mohan Rao ◽  
S Mohan
Keyword(s):  
Thin Films ◽  
High Pressure ◽  
Critical Current ◽  
Absorption Method ◽  
Pressure Oxygen ◽  
High Pressure Oxygen ◽  
Current Densities

Columnar tilt and vortex stress in superconducting thin films of NdBa2Cu3O7−δ: Magnetization critical current-density measurements

2004 ◽  
Vol 96 (12) ◽  
pp. 7403-7406 ◽  
Author(s):  
Sanghamitra Khatua ◽  
P. K. Mishra ◽  
Ravi Kumar ◽  
D. C. Kundaliya ◽  
D. Buddhikot ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Superconducting Thin Films ◽  
Density Measurements

X-ray Line Broadening Analysis of Tl-Superconducting Films

1989 ◽  
Vol 33 ◽  
pp. 145-151
Author(s):  
M. O. Eatough ◽  
D. S. Ginley ◽  
B. Morosin
Keyword(s):  
Thin Films ◽  
Superconducting Films ◽  
Electron Beam Evaporation ◽  
Superconducting Thin Films ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Current Densities ◽  
Diffraction Peaks ◽  
Sequential Electron

AbstractSuperconducting thin films (0.3-0.7μm) in the TI-Ca-Ba-Cu-0 system have been prepared on various single crystal substrates by sequential electron beam evaporation followed by appropriate sintering and annealing. Oxygen-annealed films show Tc as high as 110K and critical current densities to 600,000 A/cm2. X-ray diffraction analyses of these films show predominantly the Tl2Ca2Ba2Cu2O10 phase (c-parameter near 36Å), but some also contain up to 50 at% of the Tl2CaBa2Cu2O8 phase (c-parameter near 30Å). The complete absence of hkl reflections other than 00I demonstrates the highly oriented nature of the films as well as the absence of other Tl phases. The diffraction peaks are noticeably broader for the 36Å phase than for the 30Å phase. For a 0.7μm film such broadening is consistent with coherent sizes along the c-axis of 1200 - 1400Å and 500Å, respectively, for the 30Å and 36Å phases, and of strain values near 1.4-1.8 x 10-3 for both phases.

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