Circularly polarized light‐induced dichroism in photoelectron diffraction observed with display‐type spherical mirror analyzer

1995 ◽  
Vol 66 (2) ◽  
pp. 1510-1512 ◽  
Author(s):  
Hiroshi Daimon ◽  
Takeshi Nakatani ◽  
Shin Imada ◽  
Shigemasa Suga ◽  
Yasushi Kagoshima ◽  
...  
Keyword(s):  
Polarized Light ◽  
Display Type ◽  
Spherical Mirror ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Photoelectron Diffraction

Photoelectron angular distribution of 2H-NbSe2 studied by a display-type spherical mirror analyzer and circularly polarized light

2006 ◽  
Vol 38 (12-13) ◽  
pp. 1604-1606
Author(s):  
Fangzhun Guo ◽  
Tomohiro Matsushita ◽  
Fumihiko Matui ◽  
Yukako Kato ◽  
Hiroshi Daimon
Keyword(s):  
Angular Distribution ◽  
Polarized Light ◽  
Display Type ◽  
Spherical Mirror ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Photoelectron Angular Distribution

Direct surface-structure analysis by the peak rotation in circularly polarized light photoelectron diffraction

2001 ◽  
Vol 471 (1-3) ◽  
pp. 143-150 ◽  
Author(s):  
Hiroshi Daimon ◽  
Shin Imada ◽  
Shigemasa Suga
Keyword(s):  
Surface Structure ◽  
Structure Analysis ◽  
Polarized Light ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Photoelectron Diffraction

Effective magnetic quantum number and effective emitter–scatterer distance obtained from W 4f photoelectron diffraction induced by circularly polarized light on W( 110 )

2001 ◽  
Vol 493 (1-3) ◽  
pp. 15-22 ◽  
Author(s):  
K. Hattori ◽  
A. Kobayashi ◽  
K. Fukumoto ◽  
Y. Miyatake ◽  
H. Daimon ◽  
...  
Keyword(s):  
Quantum Number ◽  
Polarized Light ◽  
Magnetic Quantum Number ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Photoelectron Diffraction

TWO-DIMENSIONAL CIRCULARLY-POLARIZED-LIGHT PHOTOELECTRON DIFFRACTION FOR THE ANALYSIS OF MAGNETIC AND ELECTRONIC PROPERTIES ON SURFACES

2000 ◽  
Vol 07 (05n06) ◽  
pp. 643-647 ◽  
Author(s):  
K. ENOMOTO ◽  
Y. MIYATAKE ◽  
K. FUKUMOTO ◽  
A. KOBAYASHI ◽  
K. HATTORI ◽  
...  
Keyword(s):  
Electronic Properties ◽  
Polarized Light ◽  
Emission Angle ◽  
Two Dimensional ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Photoelectron Diffraction ◽  
Angle Dependence ◽  
First Time ◽  
Good Agreement

Circular dichroism has been measured in the photoelectron diffraction of bulk W 4f photoelectrons from the W(110)(1×1) clean surface. The forward focusing peaks along the symmetric axis in the diffraction pattern showed an azimuthal rotation similar to those reported in a prior experiment on Si(001) and chemically shifted W 4f photoelectrons from the W(110)(1×1)-O surface. The emission angle dependence of the rotation angles has been measured and analyzed for the first time and the angles observed are in good agreement with those calculated using the formula Δ ϕ=m/kR sin 2θ derived previously by Daimon et al. [Jpn. J. Phys.32, L1480 (1993)] considering the angular dependence of m. This property gives a basis for the analysis of structure or various magnetic and electronic properties on surfaces.

Peak rotation in photoelectron diffraction patterns by circularly polarized light

1997 ◽  
Vol 55 (7) ◽  
pp. 4120-4123 ◽  
Author(s):  
A. Chassé ◽  
P. Rennert
Keyword(s):  
Polarized Light ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Photoelectron Diffraction ◽  
Diffraction Patterns

scholarly journals Cubic Zirconia Crystalline Surface Oxide Epitaxial Formation on ZrB2(0001) Confirmed by Circularly-Polarized-Light Photoelectron Diffraction

2015 ◽  
Vol 13 (0) ◽  
pp. 111-114 ◽  
Author(s):  
Rie Horie ◽  
Fumihiko Matsui ◽  
Naoyuki Maejima ◽  
Hirosuke Matsui ◽  
Kota Tanaka ◽  
...  
Keyword(s):  
Polarized Light ◽  
Surface Oxide ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Cubic Zirconia ◽  
Photoelectron Diffraction ◽  
Crystalline Surface

ATOMIC STRUCTURE ANALYSIS OF ULTRA THIN IRON SILICIDE FILMS BY STEREO ATOMSCOPE

2006 ◽  
Vol 13 (02n03) ◽  
pp. 209-214 ◽  
Author(s):  
K. KATAOKA ◽  
F. MATSUI ◽  
Y. KATO ◽  
F. Z. GUO ◽  
T. MATSUSHITA ◽  
...  
Keyword(s):  
Structure Analysis ◽  
Iron Silicide ◽  
Three Dimensional ◽  
Polarized Light ◽  
Display Type ◽  
Spherical Mirror ◽  
Analysis Tool ◽  
Complex Structures ◽  
Circularly Polarized Light ◽  
Cscl Type

Three-dimensional atomic arrangements of ultra thin Fe silicide films were directly revealed. By using circularly polarized light with opposite helicities, forward focusing peaks with their positions shifted in photoelectron angular distribution (PEAD) patterns can be obtained. We successfully observed the PEAD patterns of ultra thin Fe silicide films from different core levels of Fe and Si atoms by display-type spherical mirror analyzer (DIANA). The element selective stereo photographs indicate similar hexagonal atomic arrangement with three-fold symmetry for Si and Fe atoms, which is consistent with a model based on a CsCl -type structure with B-type stacking. This is the first observation of stereoscopic atomic arrangements for ultra thin compound films, which implies that the stereo atomscope is very powerful structure analysis tool also for complex structures on surface.

scholarly journals Resonant photoelectron diffraction with circularly polarized light

2011 ◽  
Vol 84 (14) ◽  
Author(s):  
Martin Morscher ◽  
Frithjof Nolting ◽  
Thomas Brugger ◽  
Thomas Greber
Keyword(s):  
Polarized Light ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Photoelectron Diffraction

Differential polarization imaging of sickled cells

1988 ◽  
Vol 46 ◽  
pp. 62-63
Author(s):  
Marcos F. Maestre
Keyword(s):  
Optical Properties ◽  
Theoretical Approach ◽  
Polarized Light ◽  
Polarization Microscopy ◽  
Spectroscopic Techniques ◽  
Polarization Imaging ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Microscopic Scale ◽  
Chiral Structures

Recently we have developed a form of polarization microscopy that forms images using optical properties that have previously been limited to macroscopic samples. This has given us a new window into the distribution of structure on a microscopic scale. We have coined the name differential polarization microscopy to identify the images obtained that are due to certain polarization dependent effects. Differential polarization microscopy has its origins in various spectroscopic techniques that have been used to study longer range structures in solution as well as solids. The differential scattering of circularly polarized light has been shown to be dependent on the long range chiral order, both theoretically and experimentally. The same theoretical approach was used to show that images due to differential scattering of circularly polarized light will give images dependent on chiral structures. With large helices (greater than the wavelength of light) the pitch and radius of the helix could be measured directly from these images.

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