In situ plume-emission monitoring during pulsed-laser deposition of YBa2Cu3O7−δ and yttria-stabilized zirconia thin films

1997 ◽  
Vol 68 (1) ◽  
pp. 170-177 ◽  
Author(s):  
Jörn Göres ◽  
Pang-Jen Kung ◽  
D. B. Fenner ◽  
J. I. Budnick
2011 ◽  
Vol 191 (1) ◽  
pp. 12-23 ◽  
Author(s):  
Sebastian Heiroth ◽  
Ruggero Frison ◽  
Jennifer L.M. Rupp ◽  
Thomas Lippert ◽  
Eszter J. Barthazy Meier ◽  
...  

1999 ◽  
Vol 14 (4) ◽  
pp. 1329-1336 ◽  
Author(s):  
J. Y. Dai ◽  
H. C. Ong ◽  
R. P. H. Chang

Yttria-stabilized zirconia (YSZ) thin films grown by the pulsed laser deposition method on (0001) sapphire substrates have been studied by x-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), and scanning electron microscopy (SEM). It was found that the crystal orientation of the YSZ films changes as a function of oxygen pressure during deposition. At low oxygen pressure (50 mTorr), well-defined (111) oriented YSZ films are grown. High oxygen pressure favors the nucleation of (001) oriented YSZ grains. A model to explain the preferred growth direction of (001) YSZ is presented. Utilizing the experimental data, we have developed a two-step process to epitaxially grow high-quality (001) oriented YSZ on (0001) sapphire substrate.


2018 ◽  
Vol 47 (1) ◽  
pp. 65-67 ◽  
Author(s):  
Vitchaphol Motaneeyachart ◽  
Yasushi Hirose ◽  
Atsushi Suzuki ◽  
Shoichiro Nakao ◽  
Isao Harayama ◽  
...  

2011 ◽  
Vol 205 (19) ◽  
pp. 4495-4499 ◽  
Author(s):  
H. Hidalgo ◽  
E. Reguzina ◽  
E. Millon ◽  
A.-L. Thomann ◽  
J. Mathias ◽  
...  

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