In situ time-resolved optical studies of Al oxidation for magnetic tunnel junctions

2001 ◽  
Vol 90 (3) ◽  
pp. 1675-1677 ◽  
Author(s):  
K. Knechten ◽  
P. LeClair ◽  
J. T. Kohlhepp ◽  
H. J. M. Swagten ◽  
B. Koopmans ◽  
...  
2016 ◽  
Vol 94 (21) ◽  
Author(s):  
Christian Hahn ◽  
Georg Wolf ◽  
Bartek Kardasz ◽  
Steve Watts ◽  
Mustafa Pinarbasi ◽  
...  

1992 ◽  
Vol 280 ◽  
Author(s):  
M. Libera ◽  
T. Kim ◽  
K. Siangchaew ◽  
L. Clevenger ◽  
Q. Hong

ABSTRACTTime-resolved reflection and transmission measurements during heating are coupled with transmission electron microscopy (TEM) to study the crystallization of amorphous 75nm Co49Si51 films. The reflection decreases and the transmission increases upon crystallization. Optical data are converted to a measure of the fraction crystallized, χ=χ(T,t). A Kissinger analysis gives an activation energy for crystallization of 1.1 eV. TEM analysis of films crystallized in-situ show they are principally CoSi2 with a small amount of CoSi2. These results are being used for kinetic modelling of crystallization of amorphous Co-silicide films for potential use in Si mosfet and bipolar technologies.


2022 ◽  
Vol 17 (1) ◽  
Author(s):  
Jan Kaiser ◽  
William A. Borders ◽  
Kerem Y. Camsari ◽  
Shunsuke Fukami ◽  
Hideo Ohno ◽  
...  

2006 ◽  
Vol 99 (8) ◽  
pp. 08T311 ◽  
Author(s):  
G. I. R. Anderson ◽  
A. T. Hindmarch ◽  
C. H. Marrows ◽  
B. J. Hickey

2006 ◽  
Vol 99 (8) ◽  
pp. 08K701 ◽  
Author(s):  
A. T. Hindmarch ◽  
G. I. R. Anderson ◽  
C. H. Marrows ◽  
B. J. Hickey

2014 ◽  
Vol 104 (22) ◽  
pp. 222401 ◽  
Author(s):  
Barry N. Costanzi ◽  
Anastasia V. Riazanova ◽  
E. Dan Dahlberg ◽  
Lyubov M. Belova

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