scholarly journals Lorentz transmission electron microscopy and magnetic force microscopy characterization of NiFe/Al-oxide/Co films

2002 ◽  
Vol 91 (2) ◽  
pp. 780-784 ◽  
Author(s):  
Andrew C. C. Yu ◽  
Chester C. H. Lo ◽  
Amanda K. Petford-Long ◽  
David C. Jiles ◽  
Terunobu Miyazaki
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Transmission Electron ◽  
Lorentz Transmission Electron Microscopy ◽  
Microscopy Characterization ◽  
Al Oxide

A study of the magnetic structure of magnetic force microscope tips using transmission electron microscopy

1991 ◽  
Vol 49 ◽  
pp. 770-771
Author(s):  
S. McVitie ◽  
U. Hartmann
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Measured Signal ◽  
Magnetic Systems ◽  
Force Microscopy ◽  
Transmission Electron ◽  
Electrolytic Etching ◽  
Quantitative Basis

Magnetic force microscopy (MFM) has become an important tool in the investigation of the micromagnetic structure of magnetic systems. The interaction of stray magnetic field from a sample with a sharp magnetic tip is measured as the tip is scanned across the surface of the sample. Characterisation of the tip-sample interaction is of paramount importance if the measured signal obtained by MFM is to be put on a quantitative basis. In this paper we describe the preliminary results obtained by studying MFM tips using the Lorentz techniques of transmission electron microscopy.The MFM tips were prepared from 25nm thick Ni wire by an electrolytic etching and polishing technique which produces tips with a sharp apex of radius <100nm. The nature of the tips meant that only the very end of the tips were thin enough to be observed using 200kV electrons in TEM.

Magnetic vortices in tridimensional nanomagnetic caps observed using transmission electron microscopy and magnetic force microscopy

2008 ◽  
Vol 77 (22) ◽  
Author(s):  
Márcio M. Soares ◽  
Emilio de Biasi ◽  
Letícia N. Coelho ◽  
Maurício C. dos Santos ◽  
Fortunato S. de Menezes ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Magnetic Vortices ◽  
Transmission Electron

Piezoresponse Force Microscopy Characterization of PTO Thin Films

2009 ◽  
Vol 1186 ◽  
Author(s):  
Alessio Morelli ◽  
Sriram Venkatesan ◽  
George Palasantzas ◽  
Bart J. Kooi ◽  
Jeff De Hosson
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Piezoelectric Properties ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Transmission Electron ◽  
Film Substrate ◽  
Microscopy Characterization

AbstractThe piezoelectric properties of PTO thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

Transmission Electron Microscopy Characterization of Position-Controlled InN Nanocolumns

2008 ◽  
Vol 47 (7) ◽  
pp. 5330-5332 ◽  
Author(s):  
Satoshi Harui ◽  
Hidetoshi Tamiya ◽  
Takanobu Akagi ◽  
Hideto Miyake ◽  
Kazumasa Hiramatsu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Transmission Electron Microscopy Characterization ◽  
Microscopy Characterization
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