Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy
2007 ◽
Vol 17
(16)
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pp. 3332-3338
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2001 ◽
Vol 81
(9)
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pp. 623-629
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2021 ◽
pp. 1759-1829
2002 ◽
Vol 20
(2)
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pp. 673
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