Measurement of the Extrinsic Room‐Temperature Minority Carrier Lifetime in GaP

1972 ◽  
Vol 43 (2) ◽  
pp. 500-507 ◽  
Author(s):  
R. Z. Bachrach ◽  
O. G. Lorimor
Keyword(s):  
Room Temperature ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime

Room Temperature Steady State and Time Resolved PL Characterization of Ion Irradiation Induced Defects in 6H-SiC

2005 ◽  
Vol 483-485 ◽  
pp. 373-376
Author(s):  
Ricardo Reitano ◽  
M. Zimbone ◽  
Paolo Musumeci ◽  
P. Baeri
Keyword(s):  
Room Temperature ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Ion Irradiation ◽  
Minority Carrier Lifetime ◽  
Time Resolved ◽  
Induced Defects ◽  
Irradiation Induced Defects ◽  
Photoluminescence Peak

Photoluminescence (PL) and time resolved PL are well established as important experimental techniques to study electronic properties of SiC. We studied the influence of ionimplantation on the photoluminescence peak at 423nm and the variation of the minority carrier lifetime (MCL).

scholarly journals Minority Carrier Lifetime Measurements on 4H-SiC Epiwafers by Time-Resolved Photoluminescence and Microwave Detected Photoconductivity

2019 ◽  
Vol 963 ◽  
pp. 313-317
Author(s):  
Jan Beyer ◽  
Nadine Schüler ◽  
Jürgen Erlekampf ◽  
Birgit Kallinger ◽  
Patrick Berwian ◽  
...  
Keyword(s):  
Room Temperature ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Temperature Dependent ◽  
Lifetime Measurements ◽  
Time Resolved ◽  
Excess Carrier ◽  
Time Resolved Photoluminescence ◽  
Different Thickness

Temperature dependent microwave detected photoconductivity MDP and time-resolved photoluminescence TRPL were employed to investigate the carrier lifetime in CVD grown 4H-SiC epilayers of different thickness. The minority carrier lifetime may be found from both theMDP and defect PL decay at room temperature for all epilayers, whereas the near bandedge emission (NBE) decay is much faster for thin epilayers (<17 μm) due to the substrate proximity and only follows the minority carrier lifetime for thicker samples at lower excess carrier concentrations.

Microwave transmission method for measuring minority-carrier lifetime in silicon slices

1971 ◽  
Vol 7 (25) ◽  
pp. 754
Author(s):  
R.E. Thomas ◽  
V. Makios ◽  
S. Ogletree ◽  
R. Mckillican
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Transmission Method ◽  
Microwave Transmission

scholarly journals Marked enhancement of the photoresponsivity and minority-carrier lifetime of BaSi2 passivated with atomic hydrogen

2019 ◽  
Vol 3 (6) ◽  
Author(s):  
Zhihao Xu ◽  
Denis A. Shohonov ◽  
Andrew B. Filonov ◽  
Kazuhiro Gotoh ◽  
Tianguo Deng ◽  
...  
Keyword(s):  
Atomic Hydrogen ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Marked Enhancement
Sign in / Sign up

Export Citation Format

Share Document