Method for the determination of the capture cross sections of electrons from space-charge-limited conduction in the dark and under illumination in amorphous semiconductors
1999 ◽
Vol 79
(9)
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pp. 763-769
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2006 ◽
Vol 22
(1)
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pp. 123-126
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Keyword(s):
Keyword(s):
Keyword(s):
2011 ◽
Vol 59
(2(3))
◽
pp. 1713-1716
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