Determination of capture cross sections for as-grown electron traps in HfO2∕HfSiO stacks
2011 ◽
Vol 59
(2(3))
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pp. 1713-1716
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1999 ◽
Vol 79
(9)
◽
pp. 763-769
◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):