Dissociation processes of Kr2+ and Kr3+ studied by threshold photoelectron-photoion coincidence measurements

2005 ◽  
Vol 123 (18) ◽  
pp. 184303 ◽  
Author(s):  
H. Yoshii ◽  
K. Tsukamoto ◽  
T. Hayaishi ◽  
T. Aoto ◽  
K. Ito ◽  
...  
Keyword(s):  
Coincidence Measurements

Design of a UHV STEM for Through-The-Lens Electron Spectroscopy

1990 ◽  
Vol 48 (2) ◽  
pp. 380-381
Author(s):  
A. J. Bleeker ◽  
P. Kruit
Keyword(s):  
Secondary Electron ◽  
High Vacuum ◽  
Secondary Electron Emission ◽  
Auger Spectroscopy ◽  
Scanning Transmission Electron Microscope ◽  
Point Of View ◽  
Ultra High Vacuum ◽  
Scanning Transmission ◽  
Auger Spectra ◽  
Coincidence Measurements

Combining of the high spatial resolution of a Scanning Transmission Electron Microscope and the wealth of information from the secondary electrons and Auger spectra opens up new possibilities for materials research. In a prototype instrument at the Delft University of Technology we have shown that it is possible from the optical point of view to combine STEM and Auger spectroscopy [1]. With an Electron Energy Loss Spectrometer attached to the microscope it also became possible to perform coincidence measurements between the secondary electron signal and the EELS signal. We measured Auger spectra of carbon aluminium and Argon gas showing energy resolutions better than 1eV [2]. The coincidence measurements on carbon with a time resolution of 5 ns yielded basic insight in secondary electron emission processes [3]. However, for serious Auger spectroscopy, the specimen needs to be in Ultra High Vacuum. ( 10−10 Torr ). At this moment a new setup is in its last phase of construction.

Accuracy of coincidence measurements

1973 ◽  
Vol 112 (1-2) ◽  
pp. 151-155 ◽  
Author(s):  
Leon Grigorescu
Keyword(s):  
Coincidence Measurements

Electron-electron coincidence measurements of CH4

1975 ◽  
Vol 8 (18) ◽  
pp. 3007-3019 ◽  
Author(s):  
C Backx ◽  
G R Wight ◽  
R R Tol ◽  
M J Van der Wiel
Keyword(s):  
Coincidence Measurements

Ground surface ultralow background spectrometer: Active shielding improvements and coincidence measurements for the Gamma 3 spectrometer

2017 ◽  
Vol 126 ◽  
pp. 197-200 ◽  
Author(s):  
A. Cagniant ◽  
O. Delaune ◽  
M. Réglat ◽  
G. Douysset ◽  
P. Gross ◽  
...  
Keyword(s):  
Ground Surface ◽  
Active Shielding ◽  
Coincidence Measurements

3D-ion-momentum/high-resolution-electron coincidence measurements

2005 ◽  
Vol 144-147 ◽  
pp. 227-230 ◽  
Author(s):  
G. Prümper ◽  
K. Ueda ◽  
U. Hergenhahn ◽  
A. De Fanis ◽  
Y. Tamenori ◽  
...  
Keyword(s):  
High Resolution ◽  
Resolution Electron ◽  
Coincidence Measurements

Chemical analysis of heavy elements by identification of fission fragments through X-ray coincidence measurements

1972 ◽  
Vol 12 (2) ◽  
pp. 261-270 ◽  
Author(s):  
C. F. Moore ◽  
G. W. Phillips ◽  
R. St-Laurent ◽  
F. Hopkins ◽  
J. White ◽  
...  
Keyword(s):  
Chemical Analysis ◽  
Heavy Elements ◽  
X Ray ◽  
Fission Fragments ◽  
Coincidence Measurements
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