Surface potential measurements on Ni–(Al)GaN lateral Schottky junction using scanning Kelvin probe microscopy
2008 ◽
Vol 100
(5)
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pp. 052085
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Keyword(s):
2006 ◽
Vol 83
(11-12)
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pp. 2355-2358
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2018 ◽
Vol 10
(7)
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pp. 778-781
2013 ◽
Vol 13
(12)
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pp. 8217-8223
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Keyword(s):