Dephasing of Bloch oscillating electrons in GaAs-based superlattices due to interface roughness scattering

2006 ◽  
Vol 89 (16) ◽  
pp. 161913 ◽  
Author(s):  
T. Unuma ◽  
N. Sekine ◽  
K. Hirakawa
Keyword(s):  
Interface Roughness ◽  
Interface Roughness Scattering ◽  
Bloch Oscillating

Interface roughness scattering in type II broken-gap GaInAsSb/InAs single heterostructures

2007 ◽  
Vol 102 (11) ◽  
pp. 113710 ◽  
Author(s):  
M. P. Mikhailova ◽  
K. D. Moiseev ◽  
T. I. Voronina ◽  
T. S. Lagunova ◽  
Yu. P. Yakovlev
Keyword(s):  
Interface Roughness ◽  
Type Ii ◽  
Interface Roughness Scattering ◽  
Broken Gap

Interface roughness scattering and its impact on electron transport in relaxed and strained Si n-MOSFETs

2004 ◽  
Vol 19 (4) ◽  
pp. S155-S157 ◽  
Author(s):  
M Boriçi ◽  
J R Watling ◽  
R C W Wilkins ◽  
L Yang ◽  
J R Barker ◽  
...  
Keyword(s):  
Electron Transport ◽  
Interface Roughness ◽  
Strained Si ◽  
Interface Roughness Scattering

Interface roughness scattering-limited electron mobility in AlAs/GaAs and Ga0.5In0.5P/GaAs wells

1999 ◽  
Vol 86 (1) ◽  
pp. 459-463 ◽  
Author(s):  
B. R. Nag ◽  
Sanghamitra Mukhopadhyay ◽  
Madhumita Das
Keyword(s):  
Electron Mobility ◽  
Interface Roughness ◽  
Interface Roughness Scattering
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