Photoreflectance determination of the wetting layer thickness in the InxGa1−xAs∕GaAs quantum dot system for a broad indium content range of 0.3–1
Keyword(s):
2012 ◽
Vol 51
(8R)
◽
pp. 085501
◽
2011 ◽
Vol 50
(1)
◽
pp. 75-82
◽
Keyword(s):
1998 ◽
Vol 123-124
◽
pp. 352-355
◽
Keyword(s):