Linewidth Enhancement Factor Impact on Optical Feedback Mutual Coupled Quantum Dot Lasers

In this article, we numerically study and analyse the roles of linewidth enhancement factor (α) in the dynamic operation of the mutual regime of the transmitter and receiver quantum dot laser lasers supported by optical feedback. A set model of adequate rate equations describing the overall dynamics in a quantum dot system subjected to optical feedback were solved numerically. The results reveal a clear chaotic regime between the receiver and the transmitter lasers at α = 3, which is incredibly advantageous for secure optical communications and encoding decoding data transmission. Moreover, at the other value of linewidth enhancement factors, namely 2, 2.5, 3.5 and 4, the optical regime works in high synchronisation with either periodic or steady state forms.

Dynamic Response Prediction of Bi-State Emission of Quantum Dot Lasers Based on Machine Learning

Dual-state emission is a common and important phenomenon which takes place in semiconductor Quantum Dot Lasers at different temperature and operating conditions usually investigated from microscopic carrier interaction modeling or even rate-equations based approaches. In this study, we revisit the topic, but the investigation is here performed from a system identification perspective; we built black-box models based on artificial neural networks approach, using the Multilayer Perceptron, the Extreme Learning Machine and a hybrid Echo State Network - Extreme Learning Machine. As a case study, we focused on switch-on transient and its prediction. The study revealed the model was able to separate and to predict, from the solely total power, without using any QDL design parameters, the optical power around the ground state and first excited state lasing lines of InAs/InGaAs quantum dot laser. The error performance was low as a RMSE of 2.81 μW and MAPE of 0.50% with processing time (training and testing time) of 15.27 s, enabling the alternative model to be used in optical filtering instrumentation as low-resolution and low-cost filters for applications in which it is not economically viable to use a spectrum analyzer, which can be replaced by a simple optical power meter.

Optical information processing using dual state quantum dot lasers: complexity through simplicity

We review results on the optical injection of dual state InAs quantum dot-based semiconductor lasers. The two states in question are the so-called ground state and first excited state of the laser. This ability to lase from two different energy states is unique amongst semiconductor lasers and in combination with the high, intrinsic relaxation oscillation damping of the material and the novel, inherent cascade like carrier relaxation process, endows optically injected dual state quantum dot lasers with many unique dynamical properties. Particular attention is paid to fast state switching, antiphase excitability, novel information processing techniques and optothermally induced neuronal phenomena. We compare and contrast some of the physical properties of the system with other optically injected two state devices such as vertical cavity surface emitting lasers and ring lasers. Finally, we offer an outlook on the use of quantum dot material in photonic integrated circuits.

A Review of the Reliability of Integrated IR Laser Diodes for Silicon Photonics

With this review paper we provide an overview of the main degradation mechanisms that limit the long-term reliability of IR semiconductor lasers for silicon photonics applications. The discussion is focused on two types of laser diodes: heterogeneous III–V lasers bonded onto silicon-on-insulator wafers, and InAs quantum-dot lasers epitaxially grown on silicon. A comprehensive analysis of the reliability-oriented literature published to date reveals that state-of-the-art heterogeneous laser sources share with conventional laser diodes their major epitaxy-related degradation processes, such as the generation of non-radiative recombination centers or dopant diffusion, while eliminating cleaved facets and exposed mirrors. The lifetime of InAs quantum dot lasers grown on silicon, whose development represents a fundamental step toward a fully epitaxial integration of future photonic integrated circuits, is strongly limited by the density of extended defects, mainly misfit dislocations, protruding into the active layer of the devices. The concentration of such defects, along with inefficient carrier injection and excessive carrier overflow rates, promote recombination-enhanced degradation mechanisms that reduce the long-term reliability of these sources. The impact of these misfits can be largely eliminated with the inclusion of blocking layers.