scholarly journals Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing , Jack W. Ekin , Oxford U. Press, New York, 2006. $125.00 (673 pp.). ISBN 978-0-19-857054-7

Physics Today ◽  
2007 ◽  
Vol 60 (5) ◽  
pp. 67-68
Author(s):  
George O. Zimmerman
Keyword(s):  
New York ◽  
Low Temperature ◽  
Critical Current ◽  
Material Properties ◽  
Temperature Measurements ◽  
Experimental Techniques ◽  
Current Testing

The Effect of the Thickness of the Low Temperature AlN Nucleation Layer on the Material Properties of GaN Grown on a Double-Step AlN Buffer Layer by the MOCVD Method

2015 ◽  
Vol 45 (2) ◽  
pp. 859-866 ◽  
Author(s):  
Wei-Ching Huang ◽  
Chung-Ming Chu ◽  
Chi-Feng Hsieh ◽  
Yuen-Yee Wong ◽  
Kai-wei Chen ◽  
...  
Keyword(s):  
Low Temperature ◽  
Buffer Layer ◽  
Material Properties ◽  
Double Step ◽  
Nucleation Layer ◽  
Aln Buffer

The effect of low-temperature strain on the structure and the critical-current degradation of the superconducting alloy Nb–Ti

2005 ◽  
Vol 31 (10) ◽  
pp. 894-897
Author(s):  
O. I. Volchok ◽  
M. B. Lazareva ◽  
A. V. Mats ◽  
Ya. D. Starodubov ◽  
N. A. Chernyak ◽  
...  
Keyword(s):  
Low Temperature ◽  
Critical Current ◽  
Temperature Strain

New Kerr cell for low‐temperature measurements

1979 ◽  
Vol 50 (11) ◽  
pp. 1400-1402 ◽  
Author(s):  
J. Crossley ◽  
B. K. Morgan ◽  
M. Rujimethabhas
Keyword(s):  
Low Temperature ◽  
Temperature Measurements ◽  
Kerr Cell
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