Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study
Keyword(s):
2012 ◽
Vol 687
◽
pp. 45-50
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2017 ◽
Vol 5
(42)
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pp. 22170-22179
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Keyword(s):
2019 ◽
Vol 91
◽
pp. 133-145
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