Pattern level assembly of Ge quantum dots on Si with focused ion beam templating

2008 ◽  
Vol 93 (2) ◽  
pp. 023106 ◽  
Author(s):  
M. Gherasimova ◽  
R. Hull ◽  
M. C. Reuter ◽  
F. M. Ross
Keyword(s):  
Quantum Dots ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Ge Quantum Dots

Analysis of the three-dimensional ordering of epitaxial Ge quantum dots using focused ion beam tomography

2006 ◽  
Vol 88 (26) ◽  
pp. 263103 ◽  
Author(s):  
Alan J. Kubis ◽  
Thomas E. Vandervelde ◽  
John C. Bean ◽  
Derren N. Dunn ◽  
Robert Hull
Keyword(s):  
Quantum Dots ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Ge Quantum Dots ◽  
Focused Ion Beam Tomography

Spatially arranged chains of Ge quantum dots grown on Si substrate prepatterned by ion-beam-assisted nanoimprint lithography

2016 ◽  
Vol 13 (10-12) ◽  
pp. 882-885 ◽  
Author(s):  
Anatoly Dvurechenskii ◽  
Zhanna Smagina ◽  
Pavel Novikov ◽  
Vladimir Zinovyev ◽  
Polina Kuchinskaya ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Nanoimprint Lithography ◽  
Ion Beam ◽  
Si Substrate ◽  
Ge Quantum Dots

scholarly journals Дискриминация поперечных мод в торцевых полупроводниковых лазерах с пространственной модуляцией отражения выходных зеркал

2019 ◽  
Vol 53 (2) ◽  
pp. 211
Author(s):  
Н.Ю. Гордеев ◽  
А.С. Паюсов ◽  
И.С. Мухин ◽  
А.А. Серин ◽  
М.М. Кулагина ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Diode Lasers ◽  
High Order ◽  
Growth Technique ◽  
Lateral Modes

AbstractA post-growth technique aimed at spatial modification of facet reflectance of edge-emitting diode lasers has been proposed. It is based on the deposition of an anti-reflection coating and subsequent precise etching with a focused ion beam. The technique allowed suppressing of high-order lateral modes in 10 μm stripe lasers based on ten layers of InAs/InGaAs quantum dots.

scholarly journals Ion Synthesis: Si-Ge Quantum Dots

2018 ◽  
Vol 52 (5) ◽  
pp. 516
Author(s):  
N.N. Gerasimenko ◽  
N.S. Balakleyskiy ◽  
A.D. Volokhovskiy ◽  
D.I. Smirnov ◽  
O.A. Zaporozhan
Keyword(s):  
Quantum Dots ◽  
High Temperature ◽  
Temperature Region ◽  
Ion Beam ◽  
Self Organization ◽  
High Temperature Annealing ◽  
Ion Energies ◽  
Ion Beam Implantation ◽  
Ge Quantum Dots

AbstractWe present a method of Si–Ge QDs formation by ion beam implantation (IBI) technique and high temperature annealing for self-organization. Implantation doses varied from 10^14 to 10^17 cm^–2, ion energies ranged from 50 to 150 keV, annealing proceeded at temperature of 950 to 1050°C in argon environment. Formed QDs show strong infrared (IR) photoluminescence (PL) in the temperature region 15–250 K.

Buried single CdTe/CdMnTe quantum dots realized by focused ion beam lithography

1999 ◽  
Vol 75 (7) ◽  
pp. 956-958 ◽  
Author(s):  
G. Bacher ◽  
T. Kümmell ◽  
D. Eisert ◽  
A. Forchel ◽  
B. König ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Ion Beam Lithography

scholarly journals Focused ion beam modification of surfaces for directed self-assembly of InAs/GaAs(001) quantum dots

2007 ◽  
Vol 18 (45) ◽  
pp. 455303 ◽  
Author(s):  
Hugh McKay ◽  
Paul Rudzinski ◽  
Aaron Dehne ◽  
Joanna Mirecki Millunchick
Keyword(s):  
Quantum Dots ◽  
Self Assembly ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Ion Beam Modification

Focused-ion-beam-directed nucleation of InAs quantum dots

2007 ◽  
Vol 90 (16) ◽  
pp. 163109 ◽  
Author(s):  
H. A. McKay ◽  
A. Dehne ◽  
J. Y. Lee ◽  
J. M. Millunchick
Keyword(s):  
Quantum Dots ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Inas Quantum Dots

Photoluminescence Imaging of Focused Ion Beam Induced Individual Quantum Dots

Nano Letters ◽  
2011 ◽  
Vol 11 (3) ◽  
pp. 1040-1043 ◽  
Author(s):  
Jieun Lee ◽  
Timothy W. Saucer ◽  
Andrew J. Martin ◽  
Deborah Tien ◽  
Joanna M. Millunchick ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Focused Ion Beam ◽  
Ion Beam

scholarly journals Underlying strain-induced growth of the self-assembled Ge quantum-dots prepared by ion beam sputtering deposition

2012 ◽  
Vol 61 (1) ◽  
pp. 016804
Author(s):  
Yang Jie ◽  
Wang Chong ◽  
Jin Ying-Xia ◽  
Li Liang ◽  
Tao Dong-ping ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Ion Beam ◽  
The Self ◽  
Ion Beam Sputtering ◽  
Sputtering Deposition ◽  
Beam Sputtering ◽  
Ge Quantum Dots ◽  
Self Assembled
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