Reduced photocurrent lag using unipolar solid-state photoconductive detector structures: Application to stabilized n-i-p amorphous selenium

2010 ◽  
Vol 96 (5) ◽  
pp. 053507 ◽  
Author(s):  
A. H. Goldan ◽  
O. Tousignant ◽  
L. Laperrière ◽  
K. S. Karim
2016 ◽  
Vol 119 (2) ◽  
pp. 024508 ◽  
Author(s):  
James R. Scheuermann ◽  
Yesenia Miranda ◽  
Hongyu Liu ◽  
Wei Zhao

2010 ◽  
Vol 37 (9) ◽  
pp. 4982-4985 ◽  
Author(s):  
M. M. Wronski ◽  
W. Zhao ◽  
A. Reznik ◽  
K. Tanioka ◽  
G. DeCrescenzo ◽  
...  

2016 ◽  
Author(s):  
James R. Scheuermann ◽  
Adrian Howansky ◽  
Amir H. Goldan ◽  
Olivier Tousignant ◽  
Sébastien Levéille ◽  
...  

2015 ◽  
Vol 42 (3) ◽  
pp. 1223-1226 ◽  
Author(s):  
James R. Scheuermann ◽  
Amir H. Goldan ◽  
Olivier Tousignant ◽  
Sébastien Léveillé ◽  
Wei Zhao

MRS Bulletin ◽  
2002 ◽  
Vol 27 (11) ◽  
pp. 889-893 ◽  
Author(s):  
Yoshihiro Izumi ◽  
Yasukuni Yamane

AbstractNew solid-state x-ray imagers known as digital flat-panel x-ray detectors are about to be launched in the field of medical diagnostics. The combination of active-matrix technologies developed for active-matrix liquid-crystal displays and x-ray detection materials constitutes the basis of the detectors. Recently, two kinds of direct-conversion detectors have been developed in order to improve their performance. One is a detector using a thick x-ray photoconductor (∼1 mm) made of amorphous selenium, and the other is a novel hybrid panel detector using an x-ray photoconductor made of polycrystalline Cd(Zn)Te. As a result, excellent resolution and good linear sensitivity have been achieved. These detectors have great promise as next-generation digital imaging systems for fluoroscopy and radiography.


Author(s):  
T. J. Magee ◽  
J. Peng ◽  
J. Bean

Cadmium telluride has become increasingly important in a number of technological applications, particularly in the area of laser-optical components and solid state devices, Microstructural characterizations of the material have in the past been somewhat limited because of the lack of suitable sample preparation and thinning techniques. Utilizing a modified jet thinning apparatus and a potassium dichromate-sulfuric acid thinning solution, a procedure has now been developed for obtaining thin contamination-free samples for TEM examination.


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