Transmission electron microscope study of ion and electron beam induced structural changes ina‐Ge0.25Se0.75inorganic resist thin films

1982 ◽  
Vol 53 (8) ◽  
pp. 5975-5978 ◽  
Author(s):  
K. Balasubramanyam ◽  
L. J. Chen ◽  
A. L. Ruoff ◽  
E. D. Wolf
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Microscope Study ◽  
Electron Microscope Study ◽  
Structural Changes ◽  
Transmission Electron ◽  
Transmission Electron Microscope Study

scholarly journals Dynamic Transmission Electron Microscope Study on the Crystallization of Ion-Bombarded Amorphous Germanium Thin Films

2015 ◽  
Vol 21 (S3) ◽  
pp. 1855-1856
Author(s):  
Tian T. Li ◽  
Melissa K. Santala ◽  
Leonardus Bimo Bayu Aji ◽  
Sergei O. Kucheyev ◽  
Huai-Yu M. Cheng ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Microscope Study ◽  
Electron Microscope Study ◽  
Amorphous Germanium ◽  
Transmission Electron ◽  
Transmission Electron Microscope Study
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