Deformation mechanisms in free-standing nanoscale thin films: A quantitative in situ transmission electron microscope study

Proceedings of the National Academy of Sciences ◽

10.1073/pnas.0400066101 ◽

2004 ◽

Vol 101 (17) ◽

pp. 6335-6340 ◽

Author(s):

M. A. Haque ◽

M. T. A. Saif

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Deformation Mechanisms ◽

Free Standing ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Transmission electron microscope study of ion beam induced interfacial reactions in molybdenum thin films on silicon

Applications of Surface Science ◽

10.1016/0378-5963(82)90067-8 ◽

1982 ◽

Vol 11-12 ◽

pp. 202-208 ◽

Author(s):

L.J. Chen ◽

L.S. Hung ◽

J.W. Mayer

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Ion Beam ◽

Interfacial Reactions ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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A transmission electron microscope study of metal/chalcogenide amorphous thin films

Applied Surface Science ◽

10.1016/j.apsusc.2004.05.039 ◽

2004 ◽

Vol 234 (1-4) ◽

pp. 369-373 ◽

Author(s):

J.S Romero ◽

A.G Fitzgerald ◽

M.J Rose

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Metal Chalcogenide ◽

Amorphous Thin Films ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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In-situ optical transmission electron microscope study of exciton phonon replicas in ZnO nanowires by cathodoluminescence

Applied Physics Letters ◽

10.1063/1.4893444 ◽

2014 ◽

Vol 105 (7) ◽

pp. 071901 ◽

Author(s):

Shize Yang ◽

Xuezeng Tian ◽

Lifen Wang ◽

Jiake Wei ◽

Kuo Qi ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Optical Transmission ◽

Zno Nanowires ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Transmission electron microscope study of the crystal structures and microstructures of ZrSi and HfSi in ultrahigh vacuum deposited metal thin films on (111)Si

Journal of Applied Physics ◽

10.1063/1.357141 ◽

1994 ◽

Vol 76 (1) ◽

pp. 278-284 ◽

Author(s):

W. Y. Hseih ◽

L. J. Chen

Keyword(s):

Electron Microscope ◽

Crystal Structures ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Metal Thin Films ◽

Transmission Electron ◽

Deposited Metal ◽

Transmission Electron Microscope Study

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In situ transmission electron microscope study of single asperity sliding contacts

Tribology International ◽

10.1016/j.triboint.2009.12.066 ◽

2010 ◽

Vol 43 (5-6) ◽

pp. 1099-1103 ◽

Author(s):

K. Anantheshwara ◽

M.S. Bobji

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Sliding Contacts ◽

Single Asperity ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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An in situ transmission electron microscope study of the anomalous annealing of spatially isolated disordered zones in silicon

Journal of Physics Conference Series ◽

10.1088/1742-6596/26/1/068 ◽

2006 ◽

Vol 26 ◽

pp. 284-287 ◽

Author(s):

P D Edmondson ◽

R C Birtcher ◽

V M Vishnyakov ◽

P Lopez ◽

L Pelaz ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Transformation of mackinawite to greigite; an in situ X-ray powder diffraction and transmission electron microscope study

American Mineralogist ◽

10.2138/am-1997-3-408 ◽

1997 ◽

Vol 82 (3-4) ◽

pp. 302-309 ◽

Author(s):

Alistair R. Lennie ◽

Simon A. T. Redfern ◽

Pamela E. Champness ◽

Chris P. Stoddart ◽

Paul F. Schofield ◽

...

Keyword(s):

Electron Microscope ◽

Powder Diffraction ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

X Ray ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Transmission Electron Microscope Study of In Situ Polycrystalline Si Film Grown by Catalyzer-Enhanced Chemical Vapor Deposition

Journal of The Electrochemical Society ◽

10.1149/1.2422871 ◽

2007 ◽

Vol 154 (3) ◽

pp. J73 ◽

Author(s):

Han-Ki Kim ◽

Myung Soo Kim ◽

Jeong-Woo Park ◽

Woon Jo Cho

Keyword(s):

Chemical Vapor Deposition ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Vapor Deposition ◽

Microscope Study ◽

Electron Microscope Study ◽

Chemical Vapor ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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In-situ transmission electron microscope study on nanocrack nucleation and growth of intermetallic alloy

Scripta Materialia ◽

10.1016/s1359-6462(98)00191-2 ◽

1998 ◽

Vol 39 (4-5) ◽

pp. 519-525 ◽

Author(s):

X. Mao ◽

L. Qiao ◽

X. Li

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Nucleation And Growth ◽

Intermetallic Alloy ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Transmission electron microscope study of ion and electron beam induced structural changes ina‐Ge0.25Se0.75inorganic resist thin films

Journal of Applied Physics ◽

10.1063/1.331405 ◽

1982 ◽

Vol 53 (8) ◽

pp. 5975-5978 ◽

Author(s):

K. Balasubramanyam ◽

L. J. Chen ◽

A. L. Ruoff ◽

E. D. Wolf

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Structural Changes ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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