Transmission electron microscope study of the crystal structures and microstructures of ZrSi and HfSi in ultrahigh vacuum deposited metal thin films on (111)Si
1982 ◽
Vol 11-12
◽
pp. 202-208
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2004 ◽
Vol 234
(1-4)
◽
pp. 369-373
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2004 ◽
Vol 101
(17)
◽
pp. 6335-6340
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1999 ◽
Vol 44
◽
pp. S27-S31
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