Transmission electron microscope study of the crystal structures and microstructures of ZrSi and HfSi in ultrahigh vacuum deposited metal thin films on (111)Si

1994 ◽  
Vol 76 (1) ◽  
pp. 278-284 ◽  
Author(s):  
W. Y. Hseih ◽  
L. J. Chen
2015 ◽  
Vol 21 (S3) ◽  
pp. 1855-1856
Author(s):  
Tian T. Li ◽  
Melissa K. Santala ◽  
Leonardus Bimo Bayu Aji ◽  
Sergei O. Kucheyev ◽  
Huai-Yu M. Cheng ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document