Measurement of electron impact ionization coefficient in bulk silicon under a low‐electric field
Keyword(s):
2005 ◽
Vol 52
(10)
◽
pp. 2290-2299
◽
Keyword(s):
1995 ◽
Vol 10
(2)
◽
pp. 138-142
◽
1982 ◽
Vol 113
(1)
◽
pp. 125-135
◽
Keyword(s):
Keyword(s):
2001 ◽
Vol 7
(1)
◽
pp. 55-62
◽
1994 ◽
Vol 27
(4)
◽
pp. 801-806
◽