Accurate characterization of organic thin film transistors in the presence of gate leakage current
2015 ◽
Vol 62
(12)
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pp. 4225-4230
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2012 ◽
Vol 12
(5)
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pp. 4299-4304
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2018 ◽
Vol 26
(10)
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pp. 934-941
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2017 ◽
Vol 17
(6)
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pp. 4312-4317
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2013 ◽
Vol 21
(4)
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pp. 450-455
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2007 ◽
Vol 45
(22)
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pp. 5277-5284
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2010 ◽
Vol 28
(4)
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pp. 873-878
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