Contact stiffness of layered materials for ultrasonic atomic force microscopy

2000 ◽  
Vol 87 (10) ◽  
pp. 7491-7496 ◽  
Author(s):  
G. G. Yaralioglu ◽  
F. L. Degertekin ◽  
K. B. Crozier ◽  
C. F. Quate
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Stiffness ◽  
Layered Materials ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

2019 ◽  
Vol 10 ◽  
pp. 1636-1647 ◽  
Author(s):  
Wenting Wang ◽  
Chengfu Ma ◽  
Yuhang Chen ◽  
Lei Zheng ◽  
Huarong Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Theoretical Calculations ◽  
Contact Stiffness ◽  
Metal Layer ◽  
Experimental Results ◽  
Subsurface Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cover Thickness ◽  
Contact Resonance

Subsurface imaging of Au circuit structures embedded in poly(methyl methacrylate) (PMMA) thin films with a cover thickness ranging from 52 to 653 nm was carried out by using contact resonance atomic force microscopy (CR-AFM). The mechanical difference of the embedded metal layer leads to an obvious CR-AFM frequency shift and therefore its unambiguous differentiation from the polymer matrix. The contact stiffness contrast, determined from the tracked frequency images, was employed for quantitative evaluation. The influence of various parameter settings and sample properties was systematically investigated by combining experimental results with theoretical analysis from finite element simulations. The results show that imaging with a softer cantilever and a lower eigenmode will improve the subsurface contrast. The experimental results and theoretical calculations provide a guide to optimizing parameter settings for the nondestructive diagnosis of flexible circuits. Defect detection of the embedded circuit pattern was also carried out, which indicates the capability of imaging tiny subsurface structures smaller than 100 nm by using CR-AFM.

Study of the sensitivity and resonant frequency of the flexural modes of an atomic force microscopy microcantilever modeled by strain gradient elasticity theory

2013 ◽  
Vol 228 (8) ◽  
pp. 1299-1310 ◽  
Author(s):  
Mohammad Abbasi ◽  
Ardeshir Karami Mohammadi
Keyword(s):  
Atomic Force Microscopy ◽  
Resonant Frequency ◽  
Strain Gradient ◽  
Contact Stiffness ◽  
Current Model ◽  
Gradient Elasticity ◽  
Strain Gradient Theory ◽  
Gradient Theory ◽  
Force Microscopy ◽  
Atomic Force

In this study, the resonant frequency and sensitivity of an atomic force microscopy microcantilever are analyzed utilizing the strain gradient theory, and then the governing equation and boundary conditions are derived by a combination of the basic equations of the modified strain gradient theory and the Hamilton principle. Afterward, the resonant frequency and sensitivity of the proposed atomic force microscopy microcantilever are obtained numerically. The results of the current model are compared to those evaluated by both modified couple stress and classic beam theories. Results show that utilizing the strain gradient theory in the analysis of atomic force microscopy microcantilever dynamic behavior is necessary especially when the contact stiffness is high and the thickness of the microcantilever approaches the internal material length scale parameter.

scholarly journals Extracting Elastic Properties of Heterogeneous Layered Materials using Atomic Force Microscopy (AFM)

2013 ◽  
Vol 104 (2) ◽  
pp. 513a
Author(s):  
Jia-Jye Lee ◽  
Satish Rao ◽  
Gaurav Kaushik ◽  
Evren U. Azeloglu ◽  
Kevin D. Costa
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Properties ◽  
Layered Materials ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Understanding the friction of atomically thin layered materials

2020 ◽  
Vol 11 (1) ◽  
Author(s):  
David Andersson ◽  
Astrid S. de Wijn
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Loss ◽  
Friction And Wear ◽  
Layered Materials ◽  
Thin Sheets ◽  
Force Microscopy ◽  
Frictional Properties ◽  
Wear Protection ◽  
Atomic Force ◽  
Number Of Layers

AbstractFriction is a ubiquitous phenomenon that greatly affects our everyday lives and is responsible for large amounts of energy loss in industrialised societies. Layered materials such as graphene have interesting frictional properties and are often used as (additives to) lubricants to reduce friction and protect against wear. Experimental Atomic Force Microscopy studies and detailed simulations have shown a number of intriguing effects such as frictional strengthening and dependence of friction on the number of layers covering a surface. Here, we propose a simple, fundamental, model for friction on thin sheets. We use our model to explain a variety of seemingly contradictory experimental as well as numerical results. This model can serve as a basis for understanding friction on thin sheets, and opens up new possibilities for ultimately controlling their friction and wear protection.

Micromechanical contact stiffness devices and application for calibrating contact resonance atomic force microscopy

2016 ◽  
Vol 28 (4) ◽  
pp. 044003 ◽  
Author(s):  
Matthew R Rosenberger ◽  
Sihan Chen ◽  
Craig B Prater ◽  
William P King
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Stiffness ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance
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