ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Calculation of theoretical capacitance–voltage characteristics of 6H–SiC metal–oxide–semiconductor structures
Journal of Applied Physics
◽
10.1063/1.373676
◽
2000
◽
Vol 88
(1)
◽
pp. 424-428
◽
Cited By ~ 7
Author(s):
C. Raynaud
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Related Documents
Cited By
References
Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures
Applied Physics Letters
◽
10.1063/1.2790787
◽
2007
◽
Vol 91
(13)
◽
pp. 133510
◽
Cited By ~ 85
Author(s):
Guy Brammertz
◽
Koen Martens
◽
Sonja Sioncke
◽
Annelies Delabie
◽
Matty Caymax
◽
...
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Some electrical properties of the GaAs-anodic oxide interface on the basis of measurements of the capacitance-voltage and conductance-voltage characteristics of metal-oxide-semiconductor structures
Thin Solid Films
◽
10.1016/0040-6090(88)90675-x
◽
1988
◽
Vol 165
(1)
◽
pp. 21-28
Author(s):
St. Łos̀
◽
St. Kochowski
Keyword(s):
Electrical Properties
◽
Metal Oxide
◽
Anodic Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Oxide Interface
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Quasi-static capacitance–voltage characteristics of pentacene-based metal–oxide–semiconductor structures
Microelectronics Journal
◽
10.1016/j.mejo.2013.02.017
◽
2013
◽
Vol 44
(7)
◽
pp. 606-611
◽
Cited By ~ 6
Author(s):
C. Ucurum
◽
H. Goebel
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Static Capacitance
◽
Capacitance Voltage
Download Full-text
The inflection point of the capacitance-voltage, C(VG), characteristic and the flat-band voltage of metal-oxide-semiconductor structures
Journal of Applied Physics
◽
10.1063/1.4880399
◽
2014
◽
Vol 115
(20)
◽
pp. 204510
◽
Cited By ~ 9
Author(s):
H. M. Przewlocki
◽
T. Gutt
◽
K. Piskorski
Keyword(s):
Metal Oxide
◽
Inflection Point
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Flat Band
◽
Flat Band Voltage
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Calculation of the capacitance-voltage characteristic of GaAs, In0.53Ga0.47As, and InAs metal-oxide-semiconductor structures
Applied Physics Letters
◽
10.1063/1.3652699
◽
2011
◽
Vol 99
(16)
◽
pp. 163502
◽
Cited By ~ 10
Author(s):
T. P. O’Regan
◽
P. K. Hurley
Keyword(s):
Metal Oxide
◽
Voltage Characteristic
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Area dependent deep depletion behavior in the capacitance-voltage characteristics of metal-oxide-semiconductor structures with ultra-thin oxides
Journal of Applied Physics
◽
10.1063/1.3664767
◽
2011
◽
Vol 110
(11)
◽
pp. 114104
◽
Cited By ~ 1
Author(s):
Kuan-Ming Chen
◽
Jenn-Gwo Hwu
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Accurate determination of shallow doping profiles and interface states for metal–oxide–semiconductor structures from measured capacitance–voltage data
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
◽
10.1116/1.587122
◽
1994
◽
Vol 12
(1)
◽
pp. 342
◽
Cited By ~ 1
Author(s):
A. L. M. Osse
Keyword(s):
Metal Oxide
◽
Accurate Determination
◽
Interface States
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Capacitance Voltage
◽
Doping Profiles
Download Full-text
Capacitance-Voltage Characterization of Atomic-Layer-Deposited Al2O3/InGaAs and Al2O3/GaAs Metal-Oxide-Semiconductor Structures
ECS Transactions
◽
10.1149/1.2355699
◽
2019
◽
Vol 3
(3)
◽
pp. 59-69
◽
Cited By ~ 4
Author(s):
Peide (Peter) Ye
◽
Yi Xuan
◽
H.C. Lin
Keyword(s):
Metal Oxide
◽
Atomic Layer
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Characterization of ultrathin metal–oxide–semiconductor structures using coupled current and capacitance–voltage models based on quantum calculation
Journal of Applied Physics
◽
10.1063/1.1506000
◽
2002
◽
Vol 92
(8)
◽
pp. 4449-4458
◽
Cited By ~ 19
Author(s):
O. Simonetti
◽
T. Maurel
◽
M. Jourdain
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Quantum Calculation
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Modeling the capacitance-voltage response of In0.53Ga0.47As metal-oxide-semiconductor structures: Charge quantization and nonparabolic corrections
Applied Physics Letters
◽
10.1063/1.3436645
◽
2010
◽
Vol 96
(21)
◽
pp. 213514
◽
Cited By ~ 21
Author(s):
T. P. O’Regan
◽
P. K. Hurley
◽
B. Sorée
◽
M. V. Fischetti
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Voltage Response
◽
Semiconductor Structures
◽
Charge Quantization
◽
Capacitance Voltage
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close