Selective area growth and characterization of InGaN nanocolumns for phosphor-free white light emission

2013 ◽  
Vol 113 (11) ◽  
pp. 114306 ◽  
Author(s):  
S. Albert ◽  
A. Bengoechea-Encabo ◽  
M. A. Sanchez-Garcia ◽  
E. Calleja ◽  
U. Jahn
2014 ◽  
Vol 23 (03n04) ◽  
pp. 1450020 ◽  
Author(s):  
Steven Albert ◽  
Ana Maria Bengoechea-Encabo ◽  
Francesca Barbagini ◽  
David Lopez-Rormero ◽  
Miguel Angel Sanchez-Garcia ◽  
...  

The aim of this work is to provide an overview on the recent advances in the selective area growth (SAG) of ( In ) GaN nanostructures by plasma assisted molecular beam epitaxy, focusing on their potential as building blocks for next generation LEDs. The first three sections deal with the basic growth mechanisms of GaN SAG and the emission control in the entire ultraviolet to infrared range, including approaches for white light emission, using InGaN disks and thick segments on axial nanocolumns. SAG of axial nanostructures is developed on both GaN /sapphire templates and GaN -buffered Si (111). As an alternative to axial nanocolumns, section 4 reports on the growth and characterization of InGaN / GaN core-shell structures on an ordered array of top-down patterned GaN microrods. Finally, section 5 reports on the SAG of GaN , with and without InGaN insertion, on semi-polar (11-22) and non-polar (11-20) templates. Upon SAG the high defect density present in the templates is strongly reduced as indicated by a dramatic improvement of the optical properties. In the case of SAG on non-polar (11-22) templates, the formation of nanostructures with a low aspect ratio took place allowing for the fabrication of high-quality, non-polar GaN pseudo-templates by coalescence of these nanostructures.


Crystals ◽  
2018 ◽  
Vol 8 (9) ◽  
pp. 366 ◽  
Author(s):  
Alexana Roshko ◽  
Matt Brubaker ◽  
Paul Blanchard ◽  
Todd Harvey ◽  
Kris Bertness

Selective area growth (SAG) of GaN nanowires and nanowalls on Si(111) substrates with AlN and GaN buffer layers grown by plasma-assisted molecular beam epitaxy was studied. For N-polar samples filling of SAG features increased with decreasing lattice mismatch between the SAG and buffer. Defects related to Al–Si eutectic formation were observed in all samples, irrespective of lattice mismatch and buffer layer polarity. Eutectic related defects in the Si surface caused voids in N-polar samples, but not in metal-polar samples. Likewise, inversion domains were present in N-polar, but not metal-polar samples. The morphology of Ga-polar GaN SAG on nitride buffered Si(111) was similar to that of homoepitaxial GaN SAG.


2020 ◽  
Vol 813 ◽  
pp. 152235 ◽  
Author(s):  
A.A.G. Santiago ◽  
R.L. Tranquilin ◽  
P. Botella ◽  
F.J. Manjón ◽  
D. Errandonea ◽  
...  

Small ◽  
2011 ◽  
Vol 7 (7) ◽  
pp. 930-938 ◽  
Author(s):  
Lorenzo Mino ◽  
Diego Gianolio ◽  
Giovanni Agostini ◽  
Andrea Piovano ◽  
Marco Truccato ◽  
...  

2013 ◽  
Vol 103 (24) ◽  
pp. 241905 ◽  
Author(s):  
A. Bengoechea-Encabo ◽  
S. Albert ◽  
J. Zuñiga-Perez ◽  
P. de Mierry ◽  
A. Trampert ◽  
...  

1999 ◽  
Vol 74 (18) ◽  
pp. 2617-2619 ◽  
Author(s):  
M. A. Alam ◽  
R. People ◽  
E. Isaacs ◽  
C. Y. Kim ◽  
K. Evans-Lutterodt ◽  
...  

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