Perspective: Structural dynamics in condensed matter mapped by femtosecond x-ray diffraction

2014 ◽  
Vol 140 (2) ◽  
pp. 020901 ◽  
Author(s):  
T. Elsaesser ◽  
M. Woerner
2020 ◽  
Vol 22 (20) ◽  
pp. 11713-11723 ◽  
Author(s):  
Abhijeet Gaur ◽  
Matthias Stehle ◽  
Kristian Viegaard Raun ◽  
Joachim Thrane ◽  
Anker Degn Jensen ◽  
...  

Combination of in situ multi-edge X-ray absorption spectroscopy at the Mo K- and Fe K-edges in combination with X-ray diffraction successfully uncovered structural dynamics and phase transformations of an iron molybdate catalyst during redox cycling.


Author(s):  
Christopher D. M. Hutchison ◽  
Jasper J. van Thor

Ultrafast pump-probe X-ray crystallography has now been established at X-ray free electron lasers that operate at hard X-ray energies. We discuss the performance and development of current applications in terms of the available data quality and sensitivity to detect and analyse structural dynamics. A discussion of technical capabilities expected at future high repetition rate applications as well as future non-collinear multi-pulse schemes focuses on the possibility to advance the technique to the practical application of the X-ray crystallographic equivalent of an impulse time-domain Raman measurement of vibrational coherence. Furthermore, we present calculations of the magnitude of population differences and distributions prepared with ultrafast optical pumping of single crystals in the typical serial femtosecond crystallography geometry, which are developed for the general uniaxial and biaxial cases. The results present opportunities for polarization resolved anisotropic X-ray diffraction analysis of photochemical populations for the ultrafast time domain. This article is part of the theme issue ‘Measurement of ultrafast electronic and structural dynamics with X-rays’.


2004 ◽  
Author(s):  
Kazutaka G. Nakamura ◽  
Hiroaki Kishimura ◽  
Yoichiro Hironaka ◽  
Ken-ichi Kondo

Author(s):  
A. H. Chin ◽  
R. W. Schoenlein ◽  
T. E. Glover ◽  
P. Balling ◽  
W. P. Leemans ◽  
...  

1999 ◽  
Vol 83 (2) ◽  
pp. 336-339 ◽  
Author(s):  
A. H. Chin ◽  
R. W. Schoenlein ◽  
T. E. Glover ◽  
P. Balling ◽  
W. P. Leemans ◽  
...  

Nature ◽  
1979 ◽  
Vol 280 (5723) ◽  
pp. 558-563 ◽  
Author(s):  
Hans Frauenfelder ◽  
Gregory A. Petsko ◽  
Demetrius Tsernoglou

1991 ◽  
Vol 237 ◽  
Author(s):  
Walter P. Lowe ◽  
Roy Clarke

ABSTRACTWe present dynamic structural studies of thin films and their interface with underlying substrates using real-time x-ray diffraction. Using synchrotron light we have observed, in real-time, interface dynamics in semiconductor systems such as GexSi(i−x)/Si. The measurements show that under large temperature changes thin epitaxial layers may behave cooperatively to modify the overall strain profile. Dynamic behavior is exhibited in a series of discontinuities in the perpendicular lattice constant of the overlayer.


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