Analyzing the influence of negative gate bias stress on the transconductance of solution-processed, organic thin-film transistors

2014 ◽  
Vol 116 (7) ◽  
pp. 074507 ◽  
Author(s):  
J. Sprogies ◽  
S. Scheinert ◽  
I. Hörselmann
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Gate Bias ◽  
Organic Thin Film ◽  
Solution Processed ◽  
Bias Stress ◽  
Gate Bias Stress

Formation of Hump Effect Due to Top-Gate Bias Stress in Organic Thin-Film Transistors

2019 ◽  
Vol 40 (12) ◽  
pp. 1941-1944 ◽  
Author(s):  
Hong-Chih Chen ◽  
Yu-Ching Tsao ◽  
An-Kuo Chu ◽  
Hui-Chun Huang ◽  
Wei-Chih Lai ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Gate Bias ◽  
Organic Thin Film ◽  
Bias Stress ◽  
Gate Bias Stress

Gate bias stress effects due to polymer gate dielectrics in organic thin-film transistors

2008 ◽  
Vol 103 (4) ◽  
pp. 044506 ◽  
Author(s):  
Tse Nga Ng ◽  
Jürgen H. Daniel ◽  
Sanjiv Sambandan ◽  
Ana-Claudia Arias ◽  
Michael L. Chabinyc ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Gate Dielectrics ◽  
Organic Thin Film Transistors ◽  
Gate Bias ◽  
Organic Thin Film ◽  
Stress Effects ◽  
Bias Stress ◽  
Gate Bias Stress

scholarly journals Molecular doping for control of gate bias stress in organic thin film transistors

2014 ◽  
Vol 104 (1) ◽  
pp. 013507 ◽  
Author(s):  
Moritz P. Hein ◽  
Alexander A. Zakhidov ◽  
Björn Lüssem ◽  
Jens Jankowski ◽  
Max L. Tietze ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Gate Bias ◽  
Organic Thin Film ◽  
Bias Stress ◽  
Molecular Doping ◽  
Gate Bias Stress

Recovery-aware bias-stress degradation model for organic thin-film transistors considering drain and gate bias voltages

2020 ◽  
Vol 59 (SG) ◽  
pp. SGGG08
Author(s):  
Kunihiro Oshima ◽  
Michihiro Shintani ◽  
Kazunori Kuribara ◽  
Yasuhiro Ogasahara ◽  
Takashi Sato
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Gate Bias ◽  
Organic Thin Film ◽  
Degradation Model ◽  
Bias Stress ◽  
Stress Degradation

Dependence of Bias Stress on Hydrophobicity of Gate Insulator in Solution-Processed Organic Thin-Film Transistors

2016 ◽  
Vol 16 (8) ◽  
pp. 8618-8621 ◽  
Author(s):  
Wan-Woo Noh ◽  
Sin-Hyung Lee ◽  
Gyujeong Lee ◽  
In-Ho Lee ◽  
Hea-Lim Park ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Gate Insulator ◽  
Organic Thin Film ◽  
Solution Processed ◽  
Bias Stress

Stability of Solution-processed ZrInZnO Thin-film Transistors under Gate Bias Stress

2011 ◽  
Vol 59 (2) ◽  
pp. 353-356
Author(s):  
Tae Hoon Jeong ◽  
Si Joon Kim ◽  
Doo Hyun Yoon ◽  
Woong Hee Jeong ◽  
Dong Lim Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Gate Bias ◽  
Solution Processed ◽  
Bias Stress ◽  
Stability Of Solution ◽  
Gate Bias Stress

High-Performance Solution-Processed n-Channel Organic Thin-Film Transistors Based on a Long Chain Alkyl-Substituted C60Derivative

2010 ◽  
Vol 3 (10) ◽  
pp. 101601 ◽  
Author(s):  
Yoshinori Horii ◽  
Koichi Sakaguchi ◽  
Masayuki Chikamatsu ◽  
Reiko Azumi ◽  
Kiyoshi Yase ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
High Performance ◽  
Organic Thin Film Transistors ◽  
Organic Thin Film ◽  
Solution Processed ◽  
Long Chain
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