Defect states and charge trapping characteristics of HfO2 films for high performance nonvolatile memory applications
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2013 ◽
Vol 34
(9)
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pp. 1145-1147
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2016 ◽
Vol 69
(8)
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pp. 1347-1351
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2015 ◽
Vol 15
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pp. 123-126
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2012 ◽
Vol 12
(7)
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pp. 5318-5324
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