2013 IEEE International Conference of Electron Devices and Solid-state Circuits
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TOTAL DOCUMENTS

211

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5

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Published By IEEE

9781467325233

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

High-field transport in graphene and carbon nanotubes

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628176 ◽

2013 ◽

Author(s):

Vijay K. Arora ◽

Michael L. P. Tan

Keyword(s):

Carbon Nanotubes ◽

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Power- & area-efficiency enhancement techniques of switched-capacitor power converters for low-power applications

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628143 ◽

2013 ◽

Author(s):

Hoi Lee ◽

Zhe Hua

Keyword(s):

Low Power ◽

Power Converters ◽

Switched Capacitor ◽

Efficiency Enhancement ◽

Area Efficiency

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Modeling of an inductive link for wireless power applications

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628105 ◽

2013 ◽

Author(s):

Salahuddin Raju ◽

Mansun Chan ◽

C. Patrick Yue

Keyword(s):

Wireless Power ◽

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S band broadband RF LDMOS with excellent performance

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628078 ◽

2013 ◽

Author(s):

Ting Yu ◽

Zhiqing Qiu

Keyword(s):

Excellent Performance

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The reliability of SiGe HBT under swift heavy ion irradiation

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628148 ◽

2013 ◽

Author(s):

Yabin Sun ◽

Jun Fu ◽

Jun Xu ◽

Yudong Wang ◽

Wei Zhou ◽

...

Keyword(s):

Ion Irradiation ◽

Heavy Ion ◽

Swift Heavy Ion Irradiation ◽

Sige Hbt ◽

Heavy Ion Irradiation ◽

Swift Heavy Ion

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SiC device technology for energy efficiency and high temperature operation

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628179 ◽

2013 ◽

Author(s):

Mikael Ostling

Keyword(s):

Energy Efficiency ◽

High Temperature ◽

High Temperature Operation ◽

Device Technology

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Device variability and reliability check for ultra-thin-body and bulk oxide CMOSFETs

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628081 ◽

2013 ◽

Author(s):

Wen-Kuan Yeh ◽

Chun-Ming Lai ◽

Li-Kong Chin ◽

Po-Ying Chen

Keyword(s):

Thin Body ◽

Reliability Check

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Charge-trapping characteristics of niobium-doped La2O3 for nonvolatile memory applications

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628190 ◽

2013 ◽

Author(s):

R. P. Shi ◽

X. D. Huang ◽

C.H. Leung ◽

P. T. Lai

Keyword(s):

Nonvolatile Memory ◽

Charge Trapping ◽

Niobium Doped ◽

Memory Applications

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A fast frequency acquisition phase-locked loop using phase compensation techniques

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628038 ◽

2013 ◽

Author(s):

Feng-Lin Chiu ◽

Steve Hung-Lung Tu

Keyword(s):

Phase Locked Loop ◽

Acquisition Phase ◽

Phase Compensation

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An ultra-low power CMOS smart temperature sensor for clinical temperature monitoring

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628063 ◽

2013 ◽

Author(s):

Tao Wu ◽

Man-Kay Law ◽

Pui-In Mak ◽

Rui P. Martins

Keyword(s):

Low Power ◽

Temperature Sensor ◽

Temperature Monitoring ◽

Ultra Low Power ◽

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