BiFeO 3 (BFO) is usually considered as a multiferroic material, which shows both ferroelectric and antiferromagnetic properties at room temperature. It is an important material having potential applications in various spintronics devices. Many studies have been done to understand the ferroelectric and magnetic responses of BFO; therefore, this work is focused on characterizing the coupling effects of electric, magnetic and mechanical field on the ferroelectric properties and surface potential of the BFO thin films. A polycrystalline BFO film (~200 nm) is deposited on the Si substrate by the Pulse Laser Deposition techniques. The Vertical Piezoresponse Force Microscopy (PFM) is used to study the ferroelectric domain structure and the hysteresis loop of as-deposited BFO film as well as the effects of the mechanical stress and magnetic field on those properties. Kelvin Probe Force Microscopy (KPFM) is used to measure the surface potential of the samples. To apply the mechanical stress on the film, micro-indentations were made on the surface of the film with two different loads (1.96 N, 2.94 N). Then the ferroelectric domain structure, strain amplitude, domain switching (hysteresis response) behavior and surface potential are measured at the locations near the side of the indentation cavity and cracks. This way, the coupling effects of electric, magnetic and stress field on BFO film are studied at nanoscale.