scholarly journals Flaw characterization using inversion of eddy current response and the effect of filters and scan resolution

Author(s):  
Erin K. Oneida ◽  
Eric B. Shell ◽  
John C. Aldrin ◽  
Harold A. Sabbagh ◽  
Elias H. Sabbagh ◽  
...  
2010 ◽  
Author(s):  
B. F. Larson ◽  
C. C. H. Lo ◽  
N. Nakagawa ◽  
Donald O. Thompson ◽  
Dale E. Chimenti

2020 ◽  
Vol 56 (16) ◽  
pp. 13
Author(s):  
LI Tengyu ◽  
KOU Ziming ◽  
WU Juan ◽  
JIAO Shaoni ◽  
MAO Qinghua

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