A note on the elliptic-telegraph identification problem with non-local condition

In this study the source identification problem for the one-dimensional Schr¨odinger equation with non-local boundary conditions is considered. A second order of accuracy Crank-Nicolson difference scheme for the numerical solution of the differential problem is presented. Stability estimates are proved for the solution of this difference scheme. Numerical results are given.

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Multitask Model for Person Re-identification by Attribute-aware

10.21203/rs.3.rs-411924/v1 ◽

2021 ◽

Author(s):

Shengyu Pei ◽

Xiaoping Fan

Keyword(s):

Identification Problem ◽

Stream Network ◽

Feature Aggregation ◽

Network Modules ◽

Retrieval Problem ◽

Non Local ◽

Identity Based ◽

Generalized Mean ◽

Extraction Performance ◽

The Relationship

Abstract The image-based person re-identification problem can be transformed into a similar image retrieval problem. At present, most of the current identity-based methods do not consider pedestrian attributes. Moreover, many methods that consider pedestrian attributes and identities fail to fully simulate the relationship between pedestrian attributes and identities. In this article, we propose a new image-based person re-identification method by attribute-aware. Based on the introduction of instance batch normalization, the non-local module based on attention is used to transform the ResNet network structure to improve the feature extraction performance. After using generalized mean pooling for feature aggregation, the identity-based and attribute-based double stream network modules pay attention to the relationship between identities and pedetrian features, and the relationship between attributes and pedestrian features, so as to fully activate the relationship between pedestrian attributes and identities. Experiments are carried out on two classic person re-identification by attribute dataset Market-1501 and DukeMTMC-reID, and the results prove the effectiveness of the method. The method proposed in this paper has achieved the best performance on some evaluation metrics.

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Exponential solubility classes in a problem for the heat equation with a non-local condition for the time averages

Sbornik Mathematics ◽

10.1070/sm2005v196n09abeh003645 ◽

2005 ◽

Vol 196 (9) ◽

pp. 1319-1348 ◽

Cited By ~ 1

Author(s):

A Yu Popov ◽

I V Tikhonov

Keyword(s):

Heat Equation ◽

Local Condition ◽

Non Local ◽

Time Averages

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Toward High-Resolution Low-Voltage SEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100103152 ◽

1988 ◽

Vol 46 ◽

pp. 218-219

Author(s):

Zhifeng Shao

Keyword(s):

Low Voltage ◽

Spherical Aberration ◽

Chromatic Aberration ◽

Limiting Factor ◽

Operating Voltage ◽

Probe Radius ◽

Non Local ◽

Electron Microscopes ◽

Image Position ◽

Scanning Electron Microscopes

Recently, low voltage (≤5kV) scanning electron microscopes have become popular because of their unprecedented advantages, such as minimized charging effects and smaller specimen damage, etc. Perhaps the most important advantage of LVSEM is that they may be able to provide ultrahigh resolution since the interaction volume decreases when electron energy is reduced. It is obvious that no matter how low the operating voltage is, the resolution is always poorer than the probe radius. To achieve 10Å resolution at 5kV (including non-local effects), we would require a probe radius of 5∽6 Å. At low voltages, we can no longer ignore the effects of chromatic aberration because of the increased ratio δV/V. The 3rd order spherical aberration is another major limiting factor. The optimized aperture should be calculated as

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Chromatic aberration and low-voltage SEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100127293 ◽

1987 ◽

Vol 45 ◽

pp. 546-547

Author(s):

Zhifeng Shao ◽

A.V. Crewe

Keyword(s):

Electron Energy ◽

Low Voltage ◽

Spherical Aberration ◽

Chromatic Aberration ◽

Primary Electron ◽

Probe Size ◽

Non Local ◽

Optical Treatment ◽

Electron Microscopes ◽

Scanning Electron Microscopes

For scanning electron microscopes, it is plausible that by lowering the primary electron energy, one can decrease the volume of interaction and improve resolution. As shown by Crewe /1/, at V0 =5kV a 10Å resolution (including non-local effects) is possible. To achieve this, we would need a probe size about 5Å. However, at low voltages, the chromatic aberration becomes the major concern even for field emission sources. In this case, δV/V = 0.1 V/5kV = 2x10-5. As a rough estimate, it has been shown that /2/ the chromatic aberration δC should be less than ⅓ of δ0 the probe size determined by diffraction and spherical aberration in order to neglect its effect. But this did not take into account the distribution of electron energy. We will show that by using a wave optical treatment, the tolerance on the chromatic aberration is much larger than we expected.

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