Simulation of the effect of polarization Coulomb field scattering on device linearity in AlGaN/GaN heterostructure field effect transistors using the Monte Carlo method
2021 ◽
Vol 127
◽
pp. 114576
2014 ◽
Vol 62
◽
pp. 76-79
◽
2018 ◽
Vol 120
◽
pp. 389-394
◽