Hyper-radiosensitivity in tumor cells following exposure to low dose pulsed x-rays emitted from a kilojoule plasma focus device

2021 ◽  
Vol 130 (16) ◽  
pp. 164902
Author(s):  
Jalaj Jain ◽  
Hector Araya ◽  
Jose Moreno ◽  
Sergio Davis ◽  
Rodrigo Andaur ◽  
...  
2017 ◽  
Vol 35 (4) ◽  
pp. 656-662 ◽  
Author(s):  
J. Jain ◽  
J. Moreno ◽  
D. Morales ◽  
S. Davis ◽  
B. Bora ◽  
...  

AbstractThe temporal correlation between neutron and hard X-ray (HXR) emissions from a hundred joules plasma focus device (PF-400J) was studied. A method, time history analysis, to estimate the time of origin of neutrons with respect to HXRs is applied. In most of the discharges, it was found that neutrons are originated before HXRs in the axial direction and after HXRs in the radial direction. In some discharges, the time difference between HXRs and neutrons origin was found large enough, so that it can be interpreted that those neutrons would have been originated before the pinch. A qualitative discussion is conjectured to explain the experimental observations.


1974 ◽  
Vol 18 ◽  
pp. 184-196 ◽  
Author(s):  
R. L. Gullickson ◽  
R. H. Barlett

AbstractThe plasma focus device, a form of linear pinch discharge, produces an intense x-ray and neutron (D2) burst from a magnetically heated dense plasma. Rapidly changing magnetic fields at pinch time generate large axial electric fields which accelerate electrons and ions. In the experiments reported here the x-ray production during the plasma pinch of a 96 kilojoule (at 20 kV) plasma focus device was measured.The purpose of these experiments was to evaluate the energy in accelerated electrons in the plasma focus device and to learn how to enhance these electron hursts. Well focused, megampere electron beams at a few hundred kilovolts, lasting less than 10 nanoseconds have applications in fusionable pellet heating experiments. (1) X-rays were monitored to evaluate these electron bursts using a defocusing bent crystal spectrometer, doubly diffused silicon (PIN) detectors, with Ross filters, thermoluminescent dosimeters (TLDs) with filters, and x-ray pinhole photography.Thermoluminescent dosimeters indicated maximum x-ray yields of 140 joules above 3 keV at 57.3 kilojoules stored energy (16 kV) for a conversion efficiency to x-rays of 0.2%. 40 joules are above 60 keV and 15 joules above 80 keV. The hard x-ray pulse typically rises in 3 ns and frequently has a pulse width less than 10 ns. The low energy x-ray spectrum consists almost entirely of lines from the high Z anode insert, and the high energy spectrum is characteristic of a nonthermal power law distribution with an exponent of 2.2 ± 0.8. Peak hard x-ray production is obtained at 1 torr deuterium in contrast to peak neutron production (3 x 1010) at 5 torr. The addition of argon reduces total x-ray yield and increases the relative fraction of soft x-rays.These measurements suggest that the plasma focus produces 1200 joules of electrons with an average energy of 150 keV, in 10 nanoseconds with a stored energy of 57.3 kilojoules. This is a power of 1.2 × 1011 watts and power density of 1.5 × 1013 watts cm−2.


2008 ◽  
Vol 22 (23) ◽  
pp. 3941-3955 ◽  
Author(s):  
I. A. KHAN ◽  
M. HASSAN ◽  
R. AHMAD ◽  
G. MURTAZA ◽  
M. ZAKAULLAH ◽  
...  

Nanocrystalline zirconium nitride/oxide "zirconium oxynitride" nanocomposite film is deposited on zirconium substrate by dense plasma focus device at room temperature. X-ray diffraction of irradiated samples reveals that different phases ( ZrN , Zr 3 N 4 and ZrO 2) of zirconium nitride and zirconium oxide are evolved. The crystallinity of these phases depends on axial positions as well as ion energy flux. Scanning electron microscopy shows that the deposited film is more compact at lower axial position, which is due to higher ion energy flux. Energy dispersive X-rays spectroscopy shows that the presence of nitrogen concentration decreases by increasing the axial position. Maximum microhardness value for the deposited layer is found to be 7200 ± 12 MPa at 10 gram imposed load.


2014 ◽  
Vol 2014 ◽  
pp. 1-9 ◽  
Author(s):  
Muhammad Zubair Khan ◽  
Yap Seong Ling ◽  
Ibrar Yaqoob ◽  
Nitturi Naresh Kumar ◽  
Lim Lian Kuang ◽  
...  

A low-energy plasma focus device was used as an electron beam source. A technique was developed to simultaneously measure the electron beam intensity and energy. The system was operated in Argon filling at an optimum pressure of 1.7 mbar. A Faraday cup was used together with an array of filtered PIN diodes. The beam-target X-rays were registered through X-ray spectrometry. Copper and lead line radiations were registered upon usage as targets. The maximum electron beam charge and density were estimated to be 0.31 μC and13.5×1016/m3, respectively. The average energy of the electron beam was 500 keV. The high flux of the electron beam can be potentially applicable in material sciences.


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