Evolution of defects and charge carrier transport mechanism in fluorine-doped tin oxide thin films upon thermal treatment
2016 ◽
Vol 44
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pp. 57-63
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1999 ◽
Vol 32
(12)
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pp. 1302-1305
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2014 ◽
Vol 50
(3)
◽
pp. 310-314
◽
2015 ◽
Vol 15
(5)
◽
pp. 3934-3938
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Keyword(s):
Keyword(s):